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SPICE Level 3 and BSIM3v3.1 characterization of monolithic integrated CMOS- MEMS devices SAND981870C DE98 006179

SPICE Level 3 and BSIM3v3.1 characterization of monolithic integrated CMOS- MEMS devices SAND981870C DE98 006179
Microform規格・テクニカルリポート類
Staple, B. D, Watts, H. A, Dyck, C, Griego, A. P, Hewlett, F. W1998<LS-DE98/006179>
National Diet Library

I(sub DDQ) testing for ultimate low power design verification and defect detection SAND-94-1316C DE94 014281 CONF-9410871

I(sub DDQ) testing for ultimate low power design verification and defect detection SAND-94-1316C DE94 014281 CONF-9410871
Microform規格・テクニカルリポート類
Hawkins, C. F, Hewlett, F. W, Soden, J. M1994<LS-DE94/014281>
National Diet Library

IDDQ TESTING FOR ULTIMATE LOW POWER DESIGN VERIFICATION AND DEFECT DETECTION (SAND ; SAND-94-1316C)

IDDQ TESTING FOR ULTIMATE LOW POWER DESIGN VERIFICATION AND DEFECT DETECTION (SAND ; SAND-94-1316C)
Paper図書
HAWKINS, C.F.// HEWLETT, F.W.// SODEN, J.M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingHAWKINS, C.F. HEWLETT, F.W. SODEN, J.M.

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