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Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California

Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California
Paper図書
edited by R. Rajsuman ; sponsored by IEEE Computer Society, Technical Committee on Test TechnologyIEEE Computer Society Pressc1993
Other Libraries in Japan
  • Author HeadingIEEE International Workshop on Memory Testing Rajsuman, R.

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California
Paper図書
edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSIIEEE Computer Society Pressc1994
Other Libraries in Japan
  • Author HeadingIEEE International Workshop on Memory Testing Rajsuman, Rochit IEEE Compute...

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore
Paper図書
edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1996
Other Libraries in Japan
  • Author HeadingIEEE International Workshop on Memory Testing Rajsuman, Rochit Swee, Yong-K...

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California
Paper図書
edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1995
Other Libraries in Japan
  • Author HeadingIEEE International Workshop on Memory Testing Rajsuman, Rochit Rajkanan, K....

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