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Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002

Paper図書

edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of SingaporeInstitute of Electrical and Electronics Engineersc2002

Other Libraries in Japan

Note (General)... Chim Wai Kin, Lee Kheng Chooi
Author Heading... Chim, Wai Kin Lee, Kheng Chooi

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