edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, SingaporeInstitute of Electrical and Electronics Engineersc1995
Other Libraries in Japan
- Author Heading...rated Circuits Ong, Soon Huat Radhakrishnan, M. K. IEEE Sin...