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Common-source TLD and RADFET characterization of Co-60, Cs-137, and x-ray irradiation sources SAND-97-0349C DE97 003211 CONF-97071114

Common-source TLD and RADFET characterization of Co-60, Cs-137, and x-ray irradiation sources SAND-97-0349C DE97 003211 CONF-97071114
Microform規格・テクニカルリポート類
Simons, M, Pease, R. L, Fleetwood, D. M1997<LS-DE97/003211>
National Diet Library

Effects of emitter-tied field plates on lateral PNP ionizing radiation response SAND980625C DE98 005032 CONF980705

Effects of emitter-tied field plates on lateral PNP ionizing radiation response SAND980625C DE98 005032 CONF980705
Microform規格・テクニカルリポート類
Barnaby, H. J, Schrimpf, R. D, Cirba, C. R, Pease, R. L, Fleetwood, D. M1998<LS-DE98/005032>
National Diet Library

Mechanisms for enhanced packaging and/or burn-in total dose sensitivity in microelectronics SAND-97-0603C DE97 003730 CONF-9709342

Mechanisms for enhanced packaging and/or burn-in total dose sensitivity in microelectronics SAND-97-0603C DE97 003730 CONF-9709342
Microform規格・テクニカルリポート類
Pease, R. L, Shaneyfelt, M, Winokur, P1997<LS-DE97/003730>
National Diet Library

Dose enhancement in a room cobalt-60 source SAND-97-0424C DE97 003201 CONF-97071112

Dose enhancement in a room cobalt-60 source SAND-97-0424C DE97 003201 CONF-97071112
Microform規格・テクニカルリポート類
Simons, M, Pease, R. L, Fleetwood, D. M, Schwank, J. R, Krzesniak, M1997<LS-DE97/003201>
National Diet Library

Radiation-induced gain degradation in lateral PNP BJTs with lightly and heavily doped emitters SAND-97-0425C DE97 003203 CONF-97071115

Radiation-induced gain degradation in lateral PNP BJTs with lightly and heavily doped emitters SAND-97-0425C DE97 003203 CONF-97071115
Microform規格・テクニカルリポート類
Wu, A, Schrimpf, R. D, Pease, R. L, Fleetwood, D. M, Kosier, S. L1997<LS-DE97/003203>
National Diet Library

Mechanisms of ionizing-radiation-induced gain degradation in lateral PNP BJTs SAND-96-0564C DE96 006385 CONF-9607733

Mechanisms of ionizing-radiation-induced gain degradation in lateral PNP BJTs SAND-96-0564C DE96 006385 CONF-9607733
Microform規格・テクニカルリポート類
Schmidt, D. M, Wu, A, Schrimpf, R. D, Fleetwood, D. M, Pease, R. L1996<LS-DE96/006385>
National Diet Library

MECHANISMS OF IONIZING-RADIATION-INDUCED GAIN DEGRADATION IN LATERAL PNP BJTS (SAND ; SAND-96-0564C)

MECHANISMS OF IONIZING-RADIATION-INDUCED GAIN DEGRADATION IN LATERAL PNP BJTS (SAND ; SAND-96-0564C)
Paper図書
SCHMIDT, D.M.// WU, A.// SCHRIMPF, R.D.// FLEETWOOD, D.M.// PEASE, R.L.// COMBS, W.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan
  • Author HeadingSCHMIDT, D.M. WU, A. SCHRIMPF, R.D. FLEETWOOD, D.M. PEASE, R.L. COMBS, W.E.

ACCELERATED TESTS FOR BOUNDING THE LOW DOSE RATE RADIATION RESPONSE OF LATERAL PNP BIPOLAR JUNCTION TRANSISTORS (SAND ; SAND-96-0563C)

ACCELERATED TESTS FOR BOUNDING THE LOW DOSE RATE RADIATION RESPONSE OF LATERAL PNP BIPOLAR JUNCTION TRANSISTORS (SAND ; SAND-96-0563C)
Paper図書
WITCZAK, S.C.// SCHRIMPF, R.D.// GALLOWAY, K.F.// SCHMIDT, D.M.// FLEETWOOD, D.M.// PEASE, R.L.// COOMBS, W.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan
  • Author HeadingWITCZAK, S.C. SCHRIMPF, R.D. GALLOWAY, K.F. SCHMIDT, D.M. FLEETWOOD, D.M. PEASE, R.L. COOMBS, W.E.

BOUNDING THE TOTAL-DOSE RESPONSE OF MODERN BIPOLAR TRANSISTORS (SAND ; SAND-94-0458C)

BOUNDING THE TOTAL-DOSE RESPONSE OF MODERN BIPOLAR TRANSISTORS (SAND ; SAND-94-0458C)
Paper図書
KOSIER, S.L.// WEI, A.// SCHRIMPF, R.D.// COMBS, W.E.// FLEETWOOD, D.M.// DELAUS, M.// PEASE, R.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingKOSIER, S.L. WEI, A. SCHRIMPF, R.D. COMBS, W.E. FLEETWOOD, D.M. DELAUS, M. PEASE, R.L.

CORRELATION OF HOT-CARRIER STRESS AND IONIZATION INDUCED DEGRADATION IN BIPOLAR TRANSISTORS (SAND ; SAND-94-0459C)

CORRELATION OF HOT-CARRIER STRESS AND IONIZATION INDUCED DEGRADATION IN BIPOLAR TRANSISTORS (SAND ; SAND-94-0459C)
Paper図書
PEASE, R.L.// KOSIER, S.L.// SCHRIMPF, R.D.// COMBS, W.E.// DELAUS, M.// FLEETWOOD, D.M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingPEASE, R.L. KOSIER, S.L. SCHRIMPF, R.D. C...

HARDNESS ASSURANCE AND TESTING ISSUES FOR BIPOLAR/BICMOS DEVICES (SAND ; SAND-93-0380C)

HARDNESS ASSURANCE AND TESTING ISSUES FOR BIPOLAR/BICMOS DEVICES (SAND ; SAND-93-0380C)
Paper図書
NOWLIN, R.N.// SCHRIMPF, R.D.// FLEETWOOD, D.M.// PEASE, R.L.// COMBS, W.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingNOWLIN, R.N. SCHRIMPF, R.D. FLEETWOOD, D.M. PEASE, R.L. COMBS, W.E.

ENHANCED CHARGE TRAPPING IN BIPOLAR SPACER OXIDES DURING LOW-DOSE-RATE IRRADIATION (SAND ; SAND-94-0382C)

ENHANCED CHARGE TRAPPING IN BIPOLAR SPACER OXIDES DURING LOW-DOSE-RATE IRRADIATION (SAND ; SAND-94-0382C)
Paper図書
FLEETWOOD, D.M.// REBER, R.A. JR.// WINOKUR, P.S.// KOSIER, S.L.// SCHRIMPF, R.D.// NOWLIN, R.N.// PEASE, R.L.// DELAUS, M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author Heading.... NOWLIN, R.N. PEASE, R.L. DELAUS, M.

A programmable test system for transient annealing characterization of irradiated MOSFETS (SAND ; SAND-87-7097C; CONF-870724-14; DE87006894)

A programmable test system for transient annealing characterization of irradiated MOSFETS (SAND ; SAND-87-7097C; CONF-870724-14; DE87006894)
Paper図書
Tausch, H.J., Wemhoner, R., Pease, R.L. [et al.]Design Engineering, Inc., Mission Research Corp., Sandia National Labs., Air Force Weapons Lab.1987.1.
Other Libraries in Japan
  • Author HeadingTausch, H.J. Wemhoner, R. Pease, R.L. Schwank, J.R. Maier, R.J.

Total-dose hardness assurance for space applications of commercial CMOS devices (SAND ; SAND-89-0181C) (CONF ; CONF-890723-2)

Total-dose hardness assurance for space applications of commercial CMOS devices (SAND ; SAND-89-0181C) (CONF ; CONF-890723-2)
Paper図書
D.M. Fleetwood, P.S. Winokur, R.L. Pease1989
Other Libraries in Japan
  • Author HeadingFleetwood, D.M. Winokur, P.S. Pease, R.L.

SILICON-SOLAR-CELL DAMAGE FROM ELECTRICAL OVERSTRESS. (SAND ; SAND-82-7072C)

SILICON-SOLAR-CELL DAMAGE FROM ELECTRICAL OVERSTRESS. (SAND ; SAND-82-7072C)
Paper図書
PEASE, R.L.(et al.)Sandia National Laboratories(Sandia National Laboratories)1982.
Other Libraries in Japan
  • Author HeadingPEASE, R.L.

ELECTRICAL OVERSTRESS FAILURE IN SILICON SOLAR CELLS. (SAND ; SAND-82-7128)

ELECTRICAL OVERSTRESS FAILURE IN SILICON SOLAR CELLS. (SAND ; SAND-82-7128)
Paper図書
PEASE, R.L.(et al.)Sandia National Laboratories(Sandia National Laboratories)1982.
Other Libraries in Japan
  • Author HeadingPEASE, R.L.

LONGITUDINAL INSTABILITIES IN SYNCHROTRONS AT TRANSITION. (BNL ; BNL-13266)

LONGITUDINAL INSTABILITIES IN SYNCHROTRONS AT TRANSITION. (BNL ; BNL-13266)
Paper図書
PEASE, R.L.Brookhaven National Laboratory(Brookhaven National Laboratory)1968.
Other Libraries in Japan
  • Author HeadingPEASE, R.L.

LONGITUDINAL INSTABILITY RISE RATES. (BNL ; BNL-10169)

LONGITUDINAL INSTABILITY RISE RATES. (BNL ; BNL-10169)
Paper図書
PEASE, R.L.Brookhaven National Laboratory(Brookhaven National Laboratory)1966.
Other Libraries in Japan
  • Author HeadingPEASE, R.L.

THEORY OF LONGITUDINAL INSTABILITIES IN SYNCHROTRONS. WITH APPLICATIONS. (BNL ; BNL-11041)

THEORY OF LONGITUDINAL INSTABILITIES IN SYNCHROTRONS. WITH APPLICATIONS. (BNL ; BNL-11041)
Paper図書
PEASE, R.L.Brookhaven National Laboratory(Brookhaven National Laboratory)1966.
Other Libraries in Japan
  • Author HeadingPEASE, R.L.

On the interaction of scalar and electrostatic fields RAND/RM-1027

On the interaction of scalar and electrostatic fields RAND/RM-1027
Paper規格・テクニカルリポート類
Pease, R. L, Pease, J. S1953<M-RAND/RM-1027>
National Diet Library
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