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Time-resolved ion beam induced charge collection (TRIBICC) in micro- electronics SAND981702C DE98 007169 CONF980705

Time-resolved ion beam induced charge collection (TRIBICC) in micro- electronics SAND981702C DE98 007169 CONF980705
Microform規格・テクニカルリポート類
Schoene, H, Walsh, D. S, Sexton, F. W, Doyle, B. L, Aurand, J. F1998<LS-DE98/007169>
National Diet Library

Precursor ion damage and single event gate rupture in thin oxides SAND980452C DE98 005038 CONF980705

Precursor ion damage and single event gate rupture in thin oxides SAND980452C DE98 005038 CONF980705
Microform規格・テクニカルリポート類
Sexton, F. W, Fleetwood, D. M, Shaneyfelt, M. R, Dodd, P. E, Hash, G. L1998<LS-DE98/005038>
National Diet Library

Importance of ion energy on SEU in CMOS SRAMs SAND980626C DE98 005028 CONF980705

Importance of ion energy on SEU in CMOS SRAMs SAND980626C DE98 005028 CONF980705
Microform規格・テクニカルリポート類
Dodd, P. E, Shaneyfelt, M. R, Sexton, F. W, Hash, G. L, Winokur, P. S1998<LS-DE98/005028>
National Diet Library

Charge collection and SEU from angled ion strikes SAND-97-0483C DE97 004376 CONF-9707112

Charge collection and SEU from angled ion strikes SAND-97-0483C DE97 004376 CONF-9707112
Microform規格・テクニカルリポート類
Dodd, P. E, Shaneyfelt, M. R, Sexton, F. W1997<LS-DE97/004376>
National Diet Library

Single event gate rupture in thin gate oxides SAND-97-0426C DE97 003202 CONF-97071111

Single event gate rupture in thin gate oxides SAND-97-0426C DE97 003202 CONF-97071111
Microform規格・テクニカルリポート類
Sexton, F. W, Fleetwood, D. M, Shaneyfelt, M. R, Dodd, P. E, Hash, G. L1997<LS-DE97/003202>
National Diet Library

Application of reactors for testing neutron-induced upsets in commercial SRAMs SAND-97-1778C DE97 007906 CONF-97071118

Application of reactors for testing neutron-induced upsets in commercial SRAMs SAND-97-1778C DE97 007906 CONF-97071118
Microform規格・テクニカルリポート類
Griffin, P. J, Luera, T. F, Sexton, F. W, Cooper, P. J, Karr, S. G1997<LS-DE97/007906>
National Diet Library

Further development of the ion cross section for single event upset: model (HICUP) SAND-95-1338C DE95 014866 CONF-95071371

Further development of the ion cross section for single event upset: model (HICUP) SAND-95-1338C DE95 014866 CONF-95071371
Microform規格・テクニカルリポート類
Connell, L. W, Sexton, F. W, Prinja, A. K1995<LS-DE95/014866>
National Diet Library

SEU and SEL response of the Westinghouse 64K E(sup 2)PROM, analog devices AD7876 12-bit ADC, and the Intel 82527 Serial Communications Controller SAND-94-0449C DE95 003349 CONF-94072616

SEU and SEL response of the Westinghouse 64K E(sup 2)PROM, analog devices AD7876 12-bit ADC, and the Intel 82527 Serial Communications Controller SAND-94-0449C DE95 003349 CONF-94072616
Microform規格・テクニカルリポート類
Sexton, F. W, Hash, G. L, Connors, M. P, Murray, J. R, Schwank, J. R1994<LS-DE95/003349>
National Diet Library

Performance test results and comparative data for designated reference and equivalent methods for ozone / F.W. Sexton ... [et al.]

Performance test results and comparative data for designated reference and equivalent methods for ozone / F.W. Sexton ... [et al.]
Microform図書
1983<YCA-EP 1.89/2:600/S 4-83-003>
National Diet Library

FURTHER DEVELOPMENT OF THE ION CROSS SECTION FOR SINGLE EVENT UPSET: MODEL (HICUP) (SAND ; SAND-95-1338C)

FURTHER DEVELOPMENT OF THE ION CROSS SECTION FOR SINGLE EVENT UPSET: MODEL (HICUP) (SAND ; SAND-95-1338C)
Paper図書
CONNELL, L.W.// SEXTON, F.W.// PRINJA, A.K. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan

CRITICAL EXAMINATION OF CHARGE FUNNELING AND ITS IMPACT ON SINGLE-EVENT UPSET IN SI DEVICES (SAND ; SAND-94-0367C)

CRITICAL EXAMINATION OF CHARGE FUNNELING AND ITS IMPACT ON SINGLE-EVENT UPSET IN SI DEVICES (SAND ; SAND-94-0367C)
Paper図書
DODD, P.E.// SEXTON, F.W.// WINOKUR, P.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan

HARDNESS VARIABILITY IN COMMERCIAL AND HARDENED TECHNOLOGIES (SAND ; SAND-94-0532C)

HARDNESS VARIABILITY IN COMMERCIAL AND HARDENED TECHNOLOGIES (SAND ; SAND-94-0532C)
Paper図書
SHANEYFELT, M.R.// WINOKUR, P.S.// MEISENHEIMER, T.L.// SEXTON, F.W.// ROESKE, S.B.// KNOLL, M.G. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan

SEU AND SEL RESPONSE OF THE WESTINGHOUSE 64K E/SUP 2/PROM, ANALOG DEVICES AD7876 12-BIT ADC, AND THE INTEL 82527 SERIAL COMMUNICATIONS CONTROLLER (SAND ; SAND-94-0449C)

SEU AND SEL RESPONSE OF THE WESTINGHOUSE 64K E/SUP 2/PROM, ANALOG DEVICES AD7876 12-BIT ADC, AND THE INTEL 82527 SERIAL COMMUNICATIONS CONTROLLER (SAND ; SAND-94-0449C)
Paper図書
SEXTON, F.W.// HASH, G.L.// CONNORS, M.P.// MURRAY, J.R.// SCHWANK, J.R.// WINOKUR, P.S.// BRADLEY, E.G. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan

RELATIONSHIP BETWEEN IBICC IMAGING AND SEU IN CMOS ICS (SAND ; SAND-93-0595C)

RELATIONSHIP BETWEEN IBICC IMAGING AND SEU IN CMOS ICS (SAND ; SAND-93-0595C)
Paper図書
SEXTON, F.W.// HORN, K.M.// DOYLE, B.L.// LAIRD, J.S.// CHOLEWA, M.// SAINT, A.// LEGGE, G.J.F. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan

PROTON IRRADIATION EFFECTS ON ADVANCED DIGITAL AND MICROWAVE III-V COMPONENTS (SAND ; SAND-94-0205C)

PROTON IRRADIATION EFFECTS ON ADVANCED DIGITAL AND MICROWAVE III-V COMPONENTS (SAND ; SAND-94-0205C)
Paper図書
HASH, G.L.// SCHWANK, J.R.// SHANEYFELT, M.R.// SANDOVAL, C.E.// CONNORS, M.P.// SHERIDAN, T.J.// SEXTON, F.W.// SLAYTON, E.M.// HEISE, J.A.// FOSTER, C. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan

APPLICATION OF THE NUCLEAR MICROPROBE TO THE IMAGING OF SINGLE EVENT UPSETS IN INTEGRATED CIRCUITS (SAND ; SAND-91-0799C)

APPLICATION OF THE NUCLEAR MICROPROBE TO THE IMAGING OF SINGLE EVENT UPSETS IN INTEGRATED CIRCUITS (SAND ; SAND-91-0799C)
Paper図書
HORN, K.M.// DOYLE, B.L.// WALSH, D.S.// SEXTON, F.W. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (USA))Sandia National Laboratories(Sandia National Laboratories)1991.
Other Libraries in Japan

SINGLE EVENT UPSET IMAGING WITH A NUCLEAR MICROPROBE (SAND ; SAND-91-1521C)

SINGLE EVENT UPSET IMAGING WITH A NUCLEAR MICROPROBE (SAND ; SAND-91-1521C)
Paper図書
DOYLE, B.L.// HORN, K.M.// WALSH, D.S.// SEXTON, F.W. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1991.
Other Libraries in Japan

ION BEAM INDUCED CHARGE COLLECTION (IBICC) MICROSCOPY OF ICS: RELATION TO SINGLE EVENT UPSETS (SEU) (SAND ; SAND-92-0430C)

ION BEAM INDUCED CHARGE COLLECTION (IBICC) MICROSCOPY OF ICS: RELATION TO SINGLE EVENT UPSETS (SEU) (SAND ; SAND-92-0430C)
Paper図書
HORN, K.M.// DOYLE, B.L.// SEXTON, F.W.// LAIRD, J.S.// SAINT, A.// CHOLEWA, M.// LEGGE, G.J.F. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1992.
Other Libraries in Japan

QUALIFYING COMMERCIAL ICS FOR TOTAL-DOSE SPACE ENVIRONMENTS (SAND ; SAND-92-0382C)

QUALIFYING COMMERCIAL ICS FOR TOTAL-DOSE SPACE ENVIRONMENTS (SAND ; SAND-92-0382C)
Paper図書
SEXTON, F.W.// FLEETWOOD, D.M.// PELLETIER, J.C.// GAONA, J.I. JR.// ALDRIDGE, C.C.// GARRETT, G.// FULLER, E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1992.
Other Libraries in Japan

Radiation-hardened MOS device response to high dose rate irradiations as a function of temperature (SAND ; SAND-88-2248C; CONF-890212-2; DE88015258)

Radiation-hardened MOS device response to high dose rate irradiations as a function of temperature (SAND ; SAND-88-2248C; CONF-890212-2; DE88015258)
Paper図書
Sexton, F.W., Schwank, J.R., Kohler, R.A.Sandia National Labs.1989.1.
Other Libraries in Japan
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