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Resonance ionization of sputtered atoms: quantitative analysis in the near-surface region of silicon wafers ANL/CHM/CP-90671 DE97 003899 CONF-96111027

Resonance ionization of sputtered atoms: quantitative analysis in the near-surface region of silicon wafers ANL/CHM/CP-90671 DE97 003899 CONF-96111027
Microform規格・テクニカルリポート類
Calaway, W. F, Pellin, M. J, Spiegel, D. R, Marshall, A. H, Downey, S. W1996<LS-DE97/003899>
National Diet Library

MICROBEAM TITANIUM ISOTOPIC ANALYSIS BY RESONANCE IONIZATION MASS SPECTROMETRY (ANL ; ANL/CP-72318)

MICROBEAM TITANIUM ISOTOPIC ANALYSIS BY RESONANCE IONIZATION MASS SPECTROMETRY (ANL ; ANL/CP-72318)
Paper図書
SPIEGEL, D.R.// DAVIS, A.M.// CLAYTON, R.N.// PELLIN, M.J.// CALAWAY, W.F.// BURNETT, J.W.// COON, S.R.// YOUNG, C.E.// GRUEN, D.M. (ARGONNE NATIONAL LAB., IL (USA))Argonne National Laboratory(Argonne National Laboratory)1991.
Other Libraries in Japan
  • Author HeadingSPIEGEL, D.R. DAVIS, A.M. CLAYTON, R.N. PEL...

TRACE SURFACE ANALYSIS USING ION AND PHOTON DESORPTION WITH RESONANCE IONIZATION DETECTION (ANL ; ANL/CP-71308)

TRACE SURFACE ANALYSIS USING ION AND PHOTON DESORPTION WITH RESONANCE IONIZATION DETECTION (ANL ; ANL/CP-71308)
Paper図書
PELLIN,M.J.//YOUNG,C.E.//CALAWAY,W.F.// LYKKE,K.R.//WURZ,P.//GRUEN,D.M.//SPIEGEL,D.R.//DAVIS,A.M.//CLAYTON, R.N.(ARGONNE NATIONAL LAB.,IL(USA))Argonne National Laboratory(Argonne National Laboratory)1991.
Other Libraries in Japan

SELECTIVITY, SPECIFICITY, AND SENSITIVITY IN THE PHOTOIONIZATION OF SPUTTERED SPECIES (CONF ; CONF-9009327-1)

SELECTIVITY, SPECIFICITY, AND SENSITIVITY IN THE PHOTOIONIZATION OF SPUTTERED SPECIES (CONF ; CONF-9009327-1)
Paper図書
GRUEN, D.M.// CALAWAY, W.F.// PELLIN, M.J.// YOUNG, C.E.// SPIEGEL, D.R.// CLAYTON, R.N.// DAVIS, A.M.// BLUM, J.D. (ARGONNE NATIONAL LAB., IL (USA))1990.
Other Libraries in Japan
  • Author Heading...J. YOUNG, C.E. SPIEGEL, D.R. CLAYTON, R.N. DAVIS, A.M. BLU...

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