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ToF-SIMS : materials analysis by mass spectrometry 2nd ed

ToF-SIMS : materials analysis by mass spectrometry 2nd ed
Paper図書
edited by John C. Vickerman, David BriggsIM Publications and SurfaceSpectrac2013
Other Libraries in Japan
  • Author HeadingVickerman, J. C. Briggs, D. (David)

Surface analysis : the principal techniques : hbk : pbk 2nd ed

Surface analysis : the principal techniques : hbk : pbk 2nd ed
Paper図書
editors, John C. Vickerman, Ian S. GilmoreWiley2009
Other Libraries in Japan
  • Author HeadingVickerman, J. C. Gilmore, Ian S.

Handbook of static secondary ion mass spectrometry / D. Briggs, A. Brown, and J.C. Vickerman.

Handbook of static secondary ion mass spectrometry / D. Briggs, A. Brown, and J.C. Vickerman.
Paper図書
J. Wileyc1989.<PA2-A60>
National Diet LibraryOther Libraries in Japan
  • Author HeadingBriggs, David, 1948- Brown, A. Vickerman, J. C.

ToF-SIMS : surface analysis by mass spectrometry

ToF-SIMS : surface analysis by mass spectrometry
Paper図書
edited by John C. Vickerman and David BriggsIMc2001
Other Libraries in Japan
  • Author HeadingVickerman, J. C. Briggs, D.

Surface analysis : the principal techniques : pbk

Surface analysis : the principal techniques : pbk
Paper図書
edited by John C. VickermanJohn Wileyc1997
Other Libraries in Japan
  • Author HeadingVickerman, J. C.

Resonance ionization spectroscopy : Ninth International Symposium, Manchester, United Kingdom, June 1998

Resonance ionization spectroscopy : Ninth International Symposium, Manchester, United Kingdom, June 1998
Paper図書
editors John C. Vickerman ... [et al.]American Institute of Physicsc1998
Other Libraries in Japan
  • Author HeadingInternational Symposium on Resonance Ionization Spectroscopy and its Applications Vickerman, J. C.

Handbook of static secondary ion mass spectrometry

Handbook of static secondary ion mass spectrometry
Paper図書
D. Briggs, A. Brown, and J.C. VickermanJ. Wileyc1989
Other Libraries in Japan
  • Author HeadingBriggs, D. (David) Brown, A. (Alan) Vickerman, J. C.

Secondary ion mass spectrometry : principles and applications

Secondary ion mass spectrometry : principles and applications
Paper図書
edited by John C. Vickerman, Alan Brown, and Nicola M. ReedClarendon Press1989
Other Libraries in Japan
  • Author HeadingVickerman, J. C. Brown, A. (Alan) Reed, Nicola...

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