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Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)

Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2002.<M17-03-393>
National Diet Library
  • Author HeadingCourtois, Bernard. Wik, Thomas. Zorian, Yervant. IEEE Intern...

Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California

Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California
Paper図書
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]IEEE Computer Societyc2003
Other Libraries in Japan
  • Author Heading...ng Singh, Adit Wik, Thomas Rajsuman, Rochit IEEE Compute...

Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA : case

Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA : case
Paper図書
editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits SocietyIEEE Computer Societyc2001
Other Libraries in Japan
  • Author Heading..., B. (Bernard) Wik, Thomas Cockburn, Bruce IEEE Computer...

Proceedings : International Workshop on Memory Technology, Design, and Testing

Proceedings : International Workshop on Memory Technology, Design, and Testing
Paper図書
edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1997
Other Libraries in Japan
  • Author Heading...jsuman, Rochit Wik, Thomas IEEE Computer Society. Test T...

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