Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)

Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France.

(Memory Technology, Design and Testing)

Call No. (NDL): M17-03-393
Bibliographic ID of National Diet Library: 000004013235

Material type: 図書

Author: Courtois, Bernard.ほか

Publisher: IEEE Computer Society

Publication date: c2002.

Material Format: Paper

Capacity, size, etc.: xii, 182 p. : ill. ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Papers.Held at Isle of Bendor.IEEE cat no PR01617.

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Paper

Material Type: 図書
ISBN: 0769516173
0769516181 (bookbroker)
076951619X (microfiche)
ISSN (series): 1087-4852
Title: Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France.
Series Title: Memory Technology, Design and Testing
Author Heading: Courtois, Bernard.
Wik, Thomas.
Zorian, Yervant.
IEEE International Workshop on Memory Technology, Design and Testing (10th : 2002 : Isle of Bendor, France)
Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
Publication Date: c2002.
Publication Date (W3CDTF): 2002
Extent: xii, 182 p. : ill. ; 28 cm.
Alternative Title: MTDT 2002
Records of the 2002 IEEE international workshop on memory technology, design and testing
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Semiconductor storage devices -- Testing -- Congresses.
Random access memory -- Congresses.
LCC: TK7895.M4
NDLC: M17
Note (General): Papers.
Held at Isle of Bendor.
IEEE cat no PR01617.
Note (Bibliography): Includes bibliographic references and author index.
Holding library: 国立国会図書館
Call No.: M17-03-393
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004013235
http://id.ndl.go.jp/bib/000004013235
RLIN No.: NYCXV4312446-B
Bibliographic Record Category (NDL): 215