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Optical metrology and inspection for industrial applications V : 11-13 October 2018 : Beijing, China : conference on optical metrology and inspection for industrial applications 5 : SPIE/COS photonics Asia : Oct 2018, Beijing, China. (SPIE Proceedings ; 10819)

Optical metrology and inspection for industrial applications V : 11-13 October 2018 : Beijing, China : conference on optical metrology and inspection for industrial applications 5 : SPIE/COS photonics Asia : Oct 2018, Beijing, China. (SPIE Proceedings ; 10819)
Paper図書
SPIE[2018]<M17-20-310>
National Diet Library

Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015 : Baltimore, Maryland, United States : Apr 2015, Baltimore, MD. (SPIE Proceedings ; 9489)

Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015 : Baltimore, Maryland, United States : Apr 2015, Baltimore, MD. (SPIE Proceedings ; 9489)
Paper図書
SPIE[2015]<M17-15-3051>
National Diet Library

Dimensional optical metrology and inspection for practical applications III : 5-6 May 2014 : Baltimore, Maryland, United States : May 2014, Baltimore, MD. (SPIE Proceedings ; 9110)

Dimensional optical metrology and inspection for practical applications III : 5-6 May 2014 : Baltimore, Maryland, United States : May 2014, Baltimore, MD. (SPIE Proceedings ; 9110)
Paper図書
SPIE[2014]<M17-15-965>
National Diet Library

Dimensional optical metrology and inspection for practical applications 2 : 25-26 August 2013 : San Diego, California, United States : 2013 conference on dimensional optical metrology and inspection for practical applications : Aug 2013, San Diego, CA. (SPIE Proceedings ; 8839)

Dimensional optical metrology and inspection for practical applications 2 : 25-26 August 2013 : San Diego, California, United States : 2013 conference on dimensional optical metrology and inspection for practical applications : Aug 2013, San Diego, CA. (SPIE Proceedings ; 8839)
Paper図書
SPIEc2013.<M17-14-1500>
National Diet Library
  • Author HeadingHarding, Kevin G. Huang, Peisen S. Yoshizawa, Tōru, 1939-

Optical metrology and inspection for industrial applications 2 : 5-7 November 2012 : Beijing, China : conference on optical metrology and inspection for industrial applications 2 : Nov 2012, Beijing, China. (SPIE Proceedings ; 8563)

Optical metrology and inspection for industrial applications 2 : 5-7 November 2012 : Beijing, China : conference on optical metrology and inspection for industrial applications 2 : Nov 2012, Beijing, China. (SPIE Proceedings ; 8563)
Paper図書
SPIEc2012.<M17-13-2507>
National Diet Library
  • Author HeadingHarding, Kevin G. Huang, Peisen S. Yoshizawa, Tōru, 1939- Tsinghua University.

Dimensional optical metrology and inspection for practical applications : 22-23 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8133)

Dimensional optical metrology and inspection for practical applications : 22-23 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8133)
Paper図書
SPIEc2011.<M17-12-2008>
National Diet Library

Optical inspection and metrology for non-optics industries : 3-4 August 2009 : San Diego, California, United States. : Aug 2009, San Diego, CA. (SPIE Proceedings ; 7432)

Optical inspection and metrology for non-optics industries : 3-4 August 2009 : San Diego, California, United States. : Aug 2009, San Diego, CA. (SPIE Proceedings ; 7432)
Paper図書
SPIEc2009.<M17-10-1287>
National Diet Library
  • Author HeadingHuang, Peisen S. Yoshizawa, Tōru, 1939- Harding, Kevin G.

2011 international conference on optical instruments and technology : optoelectronic imaging and processing technology : 6-9 November 2011 : Beijing, China : 2011 international conference on optical instrument and technology : OIT2011 : Nov 2011, Beijing, China. (SPIE Proceedings ; 8200)

2011 international conference on optical instruments and technology : optoelectronic imaging and processing technology : 6-9 November 2011 : Beijing, China : 2011 international conference on optical instrument and technology : OIT2011 : Nov 2011, Beijing, China. (SPIE Proceedings ; 8200)
Paper図書
SPIEc2011.<M17-12-2566>
National Diet Library

Two- and three-dimensional methods for inspection and metrology 6 : 10-11 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7066)

Two- and three-dimensional methods for inspection and metrology 6 : 10-11 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7066)
Paper図書
SPIEc2008.<M17-09-193>
National Diet LibraryOther Libraries in Japan
  • Author HeadingHuang, Peisen S. Yoshizawa, Tōru, 1939- Harding, Kevin G.

2009 international conference on optical instruments and technology : optoelectronic imaging and process technology : 19-21 October 2009 : Shanghai, China. : 2009 international conference on optical instrument and technology : OIT'09 : Oct 2009, Shanghai, China. (SPIE Proceedings ; 7513)

2009 international conference on optical instruments and technology : optoelectronic imaging and process technology : 19-21 October 2009 : Shanghai, China. : 2009 international conference on optical instrument and technology : OIT'09 : Oct 2009, Shanghai, China. (SPIE Proceedings ; 7513)
Paper図書
SPIEc2009.<M17-10-1861>
National Diet Library
  • Author Heading...ation Chapter. Yoshizawa, Tōru, 1939- Wei, Ping. Zheng, Jesse. Inte...

Optomechatronic systems 3 : 12-14 November, 2002, Stuttgart, Germany. : Nov 2002, Stuttgart, Germany. (SPIE Proceedings ; 4902)

Optomechatronic systems 3 : 12-14 November, 2002, Stuttgart, Germany. : Nov 2002, Stuttgart, Germany. (SPIE Proceedings ; 4902)
Paper図書
SPIEc2002.<M17-03-623>
National Diet Library
  • Author HeadingDeutsche Gesellschaft für angewandte Optik e.V. (Germany) Yoshizawa, Tōru, 1939-

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