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Microoptics technology 2nd ed
Microoptics technology 2nd ed
Paper
図書
Nicholas F. Borrelli
Marcel Dekker
c2005
Other Libraries in Japan
LCC
TS517.3
Microlens arrays alk. paper
Microlens arrays alk. paper
Paper
図書
Dan Daly
Taylor & Francis
c2001
Other Libraries in Japan
LCC
TS517.3
Microoptics technology : fabrication and applications of lens arrays and devices
Microoptics technology : fabrication and applications of lens arrays and devices
Paper
図書
Nicholas F. Borrelli
Marcel Dekker
c1999
Other Libraries in Japan
LCC
TS517.3
Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California / cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors. (Proceedings of SPIE--the International Society for Optical Engineers ; v. 525)
Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California / cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors. (Proceedings of SPIE--the International Society for Optical Engineers ; v. 525)
Paper
図書
SPIE--the International Society for Optical Engineering
c1985.
<M15-A1722>
National Diet Library
LCC
TS517.3
Mounting lenses in optical instruments
Mounting lenses in optical instruments
Paper
図書
Paul R. Yoder, Jr
SPIE Optical Engineering Press
c1995
Other Libraries in Japan
LCC
TS517.3
Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California pbk.
Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California pbk.
Paper
図書
cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors
SPIE--the International Society for Optical Engineering
c1985
Other Libraries in Japan
LCC
TS517.3
Optical production technology 2nd ed
Optical production technology 2nd ed
Paper
図書
D.F. Horne
Hilger
c1983
Other Libraries in Japan
LCC
TS517.3
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