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Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California / cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors. (Proceedings of SPIE--the International Society for Optical Engineers ; v. 525)

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Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California / cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors.

(Proceedings of SPIE--the International Society for Optical Engineers ; v. 525)

Call No. (NDL)
M15-A1722
Bibliographic ID of National Diet Library
000003127562
Material type
図書
Author
Baker, L. R. (Lionel R.)ほか
Publisher
SPIE--the International Society for Optical Engineering
Publication date
c1985.
Material Format
Paper
Capacity, size, etc.
vi, 198 p. : ill. ; 28 cm.
NDC
-
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Paper

Material Type
図書
ISBN
0892525606 (pbk.)
Title
Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California / cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors.
Series Title
Proceedings of SPIE--the International Society for Optical Engineers ; v. 525
Author Heading
Baker, L. R. (Lionel R.)
Bennett, Harold Earl, 1929-
Sira Limited.
Publication, Distribution, etc.
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering
Publication Date
c1985.
Publication Date (W3CDTF)
1985
Extent
vi, 198 p. : ill. ; 28 cm.
Place of Publication (Country Code)
US