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Test and diagnosis for small-delay defects

Test and diagnosis for small-delay defects
Paper図書
Mohammad Tehranipoor, Ke Peng, Krishnendu ChakrabartySpringerc2011
Other Libraries in Japan
  • Subject Heading...ion -- Testing Delay faults (Semiconductors)
  • Subject Heading (ID)...ion -- Testing Delay faults (Semiconductors)

Logical effort : designing fast CMOS circuits

Logical effort : designing fast CMOS circuits
Paper図書
Ivan Sutherland, Robert Sproull and David HarrisMorgan Kaufmann Publishersc1999
Other Libraries in Japan
  • Subject Heading...n Logic design Delay faults (Semiconductors)
  • Subject Heading (ID)...n Logic design Delay faults (Semiconductors)

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