Search results for "Engineering inspection -- Automation -- Congresses." | NDL Search

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Machine vision applications in industrial inspection 15 : 29-30 January 2007 : San Jose, California, USA. : Jan 2007, San Jose, CA. (SPIE Proceedings ; 6503)

Paper図書

SPIEc2007.<M17-07-1317>

National Diet LibraryOther Libraries in Japan

Subject HeadingEngineering inspection -- Automation -- Congresses. Computer vision -- Industrial...

Machine vision applications in industrial inspection 14 : 16-17 January 2006 : San Jose, California, USA. : Jan 2006, San Jose, CA. (SPIE Proceedings ; 6070)

Paper図書

SPIEc2006.<M17-06-1192>

National Diet LibraryOther Libraries in Japan

Machine vision applications in industrial inspection 12 : 21-22 January 2004 : San Jose, California, USA. : Jan 2004, San Jose, CA. (SPIE Proceedings ; 5303)

Paper図書

SPIEc2004.<M17-04-2557>

National Diet LibraryOther Libraries in Japan

Machine vision applications in industrial inspection 11 : 22-24 January 2003 : Santa Clara, California, USA. : Jan 2003, Santa Clara, CA. (SPIE Proceedings ; 5011)

Paper図書

SPIEc2003.<M17-03-5242>

National Diet Library

Machine vision applications in industrial inspection 10 : 21-22 January 2002, San Jose, USA. : Jan 2002, San Jose, CA. (SPIE Proceedings ; 4664)

Paper図書

SPIEc2002.<M17-03-3360>

National Diet LibraryOther Libraries in Japan

Subject HeadingEngineering inspection -- Automation -- Congresses. Computer vision -- Industrial...

Proceedings of the 5th International Conference on Automated Inspection and Product Control [and] 12.IPA Arbeitstagung, Stuttgart, Germany, 24-26 June 1980 / sponsored and organised by Institut für Produktionstechnik und Automatisierung (IPA), Stuttgart, Germany [and] IFS (Conferences) Ltd., Bedford, UK [and] Verein zur Förderung Produktionstechnischer Forschung E.V. (FPF), S[t]uttgart, Germany.

Paper図書

IFS (Publications) Ltd.1980.<M271-91>

National Diet Library

Subject HeadingEngineering inspection -- Automation -- Congresses. Engineering components -- Aut...

Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA

Paper図書

Martin A. Hunt, Jeffery R. Price, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc2003

Other Libraries in Japan

Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California

Paper図書

Kenneth W. Tobin, Ning S. Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc1999

Other Libraries in Japan

Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California

Paper図書

Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc2000

Other Libraries in Japan

Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts

Paper図書

chairs/editors: Bruce G. Batchelor, John W.V. Miller, Susan Snell Soloman ; sponsored by SPIE - the International Society for Optical Engineering ; endorsed by MVA/SME - Machine Vision Association of the Society of Manufacturing EngineersSPIEc1998

Other Libraries in Japan

Machine vision applications in industrial inspection VI : 27 January 1998, San Jose, California

Paper図書

A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical EngineeringSPIEc1998

Other Libraries in Japan

Machine vision applications in industrial inspection V : 10-11 February, 1997, San Jose, California

Paper図書

A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical EngineeringSPIEc1997

Other Libraries in Japan

Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China

Paper図書

Shenghua Ye, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]SPIEc1998

Other Libraries in Japan

Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore

Paper図書

Anthony Tung-Shuen Ho, Sreenivas Rao, Lee Ming Cheng, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SPIE Singapore Chapter, [and] Institute of Physics Singapore ; cosponsored by SPIE Japan Chapter ... [et al.] ; cooperating organizations, Nanyang Technological University (Singapore) ... [et al.]SPIEc1997

Other Libraries in Japan

Machine vision applications in industrial inspection IV : 31 January-1 February, 1996, San Jose, California

Paper図書

A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc1996

Other Libraries in Japan

Automated optical inspection for industry : 6-7 November 1996, Beijing, China

Paper図書

Frederick Y. Wu, Shenghua Ye, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]SPIEc1996

Other Libraries in Japan

International Conference on Manufacturing Automation : 10-12 August 1992, Hong Kong

Paper図書

Anand Asundi, S.T. Tan, chairs/editors ; organized by the University of Hong Kong, Department of Mechanical Engineering ; sponsored by ASM Assembly Automation Ltd. ... [et al.]SPIEc1993

Other Libraries in Japan

Sensors and control for automation : 22-24 June, Frankfort, FRG

Paper図書

Marcus Becker, R.W. Daniel, Otmar Loffeld, chairs/editors ; sponsored by the Commission of the European Communities, Directorate General for Sciences, Research and Development, EOS--the European Optical Society, SPIE-the International Society for Optical EngineeringSPIE--the International Society for Optical Engineeringc1994

Other Libraries in Japan

Machine vision systems integration : proceedings of a conference held 6-7 November 1990, Boston, Massachusetts : hc : pbk

Paper図書

Bruce G. Batchelor, Frederick M. Waltz, editors ; sponsored by SPIE--The International Society for Optical EngineeringSPIE Optical Engineering Pressc1991

Other Libraries in Japan

Vision '90 : conference proceedings, November 12-15, 1990, Detroit, Michigan

Paper図書

sponsored by the Machine Vision Association of the Society of Manufacturing EngineersSociety of Manufacturing Engineersc1990

Other Libraries in Japan

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