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Machine vision : automated visual inspection : theory, practice and applications

Machine vision : automated visual inspection : theory, practice and applications
Paper図書
Jürgen Beyerer, Fernando Puente León, Christian Frese.Springer[2016]<M154-B202>
National Diet Library
  • Subject HeadingComputer vision. Computer vision--Industrial applications. Engineering inspection--Automation.

Machine vision applications in industrial inspection 15 : 29-30 January 2007 : San Jose, California, USA. : Jan 2007, San Jose, CA. (SPIE Proceedings ; 6503)

Machine vision applications in industrial inspection 15 : 29-30 January 2007 : San Jose, California, USA. : Jan 2007, San Jose, CA. (SPIE Proceedings ; 6503)
Paper図書
SPIEc2007.<M17-07-1317>
National Diet LibraryOther Libraries in Japan

Image processing, concepts, methodologies and applications : hardback

Image processing, concepts, methodologies and applications : hardback
Paper図書
edited by Muthukumaran Malarvel ... [et al.]Scrivenerc2020
Other Libraries in Japan

Machine vision applications in industrial inspection 14 : 16-17 January 2006 : San Jose, California, USA. : Jan 2006, San Jose, CA. (SPIE Proceedings ; 6070)

Machine vision applications in industrial inspection 14 : 16-17 January 2006 : San Jose, California, USA. : Jan 2006, San Jose, CA. (SPIE Proceedings ; 6070)
Paper図書
SPIEc2006.<M17-06-1192>
National Diet LibraryOther Libraries in Japan

Machine vision applications in industrial inspection 12 : 21-22 January 2004 : San Jose, California, USA. : Jan 2004, San Jose, CA. (SPIE Proceedings ; 5303)

Machine vision applications in industrial inspection 12 : 21-22 January 2004 : San Jose, California, USA. : Jan 2004, San Jose, CA. (SPIE Proceedings ; 5303)
Paper図書
SPIEc2004.<M17-04-2557>
National Diet LibraryOther Libraries in Japan

Machine vision applications in industrial inspection 11 : 22-24 January 2003 : Santa Clara, California, USA. : Jan 2003, Santa Clara, CA. (SPIE Proceedings ; 5011)

Machine vision applications in industrial inspection 11 : 22-24 January 2003 : Santa Clara, California, USA. : Jan 2003, Santa Clara, CA. (SPIE Proceedings ; 5011)
Paper図書
SPIEc2003.<M17-03-5242>
National Diet Library

Machine vision applications in industrial inspection 10 : 21-22 January 2002, San Jose, USA. : Jan 2002, San Jose, CA. (SPIE Proceedings ; 4664)

Machine vision applications in industrial inspection 10 : 21-22 January 2002, San Jose, USA. : Jan 2002, San Jose, CA. (SPIE Proceedings ; 4664)
Paper図書
SPIEc2002.<M17-03-3360>
National Diet LibraryOther Libraries in Japan

Intelligent visual inspection : using artificial neural networks

Intelligent visual inspection : using artificial neural networks
Paper図書
Ryan G. RosandichChapman & Hall1997
Other Libraries in Japan

Proceedings of the 5th International Conference on Automated Inspection and Product Control [and] 12.IPA Arbeitstagung, Stuttgart, Germany, 24-26 June 1980 / sponsored and organised by Institut für Produktionstechnik und Automatisierung (IPA), Stuttgart, Germany [and] IFS (Conferences) Ltd., Bedford, UK [and] Verein zur Förderung Produktionstechnischer Forschung E.V. (FPF), S[t]uttgart, Germany.

Proceedings of the 5th International Conference on Automated Inspection and Product Control [and] 12.IPA Arbeitstagung, Stuttgart, Germany, 24-26 June 1980 / sponsored and organised by Institut für Produktionstechnik und Automatisierung (IPA), Stuttgart, Germany [and] IFS (Conferences) Ltd., Bedford, UK [and] Verein zur Förderung Produktionstechnischer Forschung E.V. (FPF), S[t]uttgart, Germany.
Paper図書
IFS (Publications) Ltd.1980.<M271-91>
National Diet Library

Shape detection in computer vision using the Hough transform : gw : us

Shape detection in computer vision using the Hough transform : gw : us
Paper図書
V.F. LeaversSpringer-Verlagc1992
Other Libraries in Japan

Automated inspection and quality assurance

Automated inspection and quality assurance
Paper図書
Stanley L. Robinson, Richard K. MillerM. Dekkerc1989
Other Libraries in Japan

Nondestructive evaluation of materials by infrared thermography : gw : us

Nondestructive evaluation of materials by infrared thermography : gw : us
Paper図書
Xavier P. V. MaldagueSpringer-Verlagc1993
Other Libraries in Japan

Computer vision, models and inspection

Computer vision, models and inspection
Paper図書
by A.D. Marshall and R.R. MartinWorld Scientificc1992
Other Libraries in Japan

Robots in inspection 1st ed

Robots in inspection 1st ed
Paper図書
Jay Lee, editor ; Robert E. King, managerSociety of Manufacturing Engineers, Machine Vision Association of SME, Robotics International of SME, Publications Development Dept.c1987
Other Libraries in Japan

Proceedings of the 8th International Conference on Automated Inspection and Product Control, 23-25 June 1987, Chicago, USA : AIPC8

Proceedings of the 8th International Conference on Automated Inspection and Product Control, 23-25 June 1987, Chicago, USA : AIPC8
Paper図書
edited by K.E. McKeeIFS (Publications)1987
Other Libraries in Japan

Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts

Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts
Paper図書
John W.V. Miller, Susan Snell Solomon, Bruce G. Batchelor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc1999
Other Libraries in Japan

Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA

Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA
Paper図書
Martin A. Hunt, Jeffery R. Price, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc2003
Other Libraries in Japan

Automated visual inspection : North-Holland

Automated visual inspection : North-Holland
Paper図書
edited by B.G. Batchelor, D.A. Hill, and D.C. HodgsonIFS (Publications)1985
Other Libraries in Japan

Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California

Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California
Paper図書
Kenneth W. Tobin, Ning S. Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc1999
Other Libraries in Japan

Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California

Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California
Paper図書
Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc2000
Other Libraries in Japan
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