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Study on Defects in SiC MOS Structures and Mobility-Limiting Factors of MOSFETs

Study on Defects in SiC MOS Structures and Mobility-Limiting Factors of MOSFETs
Digital博士論文障害者向け資料あり
Kobayashi, Takuma2018-03-26
Available onlineNational Diet LibraryOther Libraries in Japan
  • Subject Heading...-Semiconductor Interface State Density Mobility-Limiting Factor Fiel...

SiC MOSFETにおける短チャネル効果と移動度向上に関する研究

SiC MOSFETにおける短チャネル効果と移動度向上に関する研究
Digital博士論文
立木, 馨大Kyoto University2022-03-23
Available onlineOther Libraries in Japan
  • Subject HeadingSiC MOSFET Interface State Density Channel Mobility Passivation

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