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Data analysis and modeling for process control 3 : 23 February 2006 : San Jose, California, USA. : Feb 2006, San Jose, CA. (SPIE Proceedings ; 6155)

Data analysis and modeling for process control 3 : 23 February 2006 : San Jose, California, USA. : Feb 2006, San Jose, CA. (SPIE Proceedings ; 6155)
Paper図書
SPIEc2006.<M17-06-1867>
National Diet Library
  • Subject Heading...-- Congresses. Manufacturing processes -- Automatic control -- Congresses. Intelligent control systems -...

Data analysis and modeling for process control : 26-27 February 2004 : Santa Clara, California, USA. : Feb 2004, Santa Clara, CA. (SPIE Proceedings ; 5378)

Data analysis and modeling for process control : 26-27 February 2004 : Santa Clara, California, USA. : Feb 2004, Santa Clara, CA. (SPIE Proceedings ; 5378)
Paper図書
SPIEc2004.<M17-04-2627>
National Diet Library
  • Subject Heading...-- Congresses. Manufacturing processes -- Automatic control -- Congresses. Intelligent control systems -...

Data analysis and modeling for process control III : 23 February, 2006, San Jose, California, USA

Data analysis and modeling for process control III : 23 February, 2006, San Jose, California, USA
Paper図書
Iraj Emami, Kenneth W. Tobin, Jr. ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, SEMATECH, IncSPIEc2006
Other Libraries in Japan

Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA

Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA
Paper図書
Iraj Emami, chair/editor ; Christopher P. Ausschnitt, Kenneth W. Tobin, Jr., cochair/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organization, International SEMATECH ; published by SPIE--the International Society for Optical EngineeringSPIEc2005
Other Libraries in Japan

Data analysis and modeling for process control : 26-27 February 2004, Santa Clara, California, USA

Data analysis and modeling for process control : 26-27 February 2004, Santa Clara, California, USA
Paper図書
Kenneth W. Tobin, Jr., chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International [and] International SEMATECHSPIEc2004
Other Libraries in Japan

Control of manufacturing processes : presented at the Winter Annual Meeting of the American Society of Mechanical Engineers, Atlanta, Georgia, December 1-6, 1991

Control of manufacturing processes : presented at the Winter Annual Meeting of the American Society of Mechanical Engineers, Atlanta, Georgia, December 1-6, 1991
Paper図書
sponsored by the Production Engineering Division and the Dynamic Systems and Control Division, ASME ; edited by K. Danai, S. MalkinASMEc1991
Other Libraries in Japan

Control issues in manufacturing processes : presented at the Winter Annual Meeting of the American Society of Mechanical Engineers, San Francisco, California, December 10-15, 1989

Control issues in manufacturing processes : presented at the Winter Annual Meeting of the American Society of Mechanical Engineers, San Francisco, California, December 10-15, 1989
Paper図書
sponsored by the Manufacturing Technology Panel of the Dynamic Systems and Control Division, ASME ; edited by J.L. Stein, Y. Koren, J. HolmesThe American Society of Mechanical Engineersc1989
Other Libraries in Japan

Modeling, sensing, and control of manufacturing processes : presented at the Winter Annual Meeting of the American Society of Mechanical Engineers, Anaheim, California, December 7-12, 1986

Modeling, sensing, and control of manufacturing processes : presented at the Winter Annual Meeting of the American Society of Mechanical Engineers, Anaheim, California, December 7-12, 1986
Paper図書
sponsored by the Production Engineering Division and the Dynamic Systems and Control Division, ASME ; edited by K. Srinivasan, D.E. Hardt, R. KomanduriASMEc1986
Other Libraries in Japan

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