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Test structure implementation document [microform] : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory (NIST special publication ; 400-97) (Semiconductor measurement technology)

Test structure implementation document [microform] : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory (NIST special publication ; 400-97) (Semiconductor measurement technology)
Microform図書
1995<YCA-C 13.10:400-97>
National Diet Library
  • Subject HeadingMicrowave integrated circuits -- Design -- Data processing Gallium arsenide semiconducto...

Electromagnetic and circuit modelling of multiconductor transmission lines

Electromagnetic and circuit modelling of multiconductor transmission lines
Paper図書
Niels Faché, Frank Olyslager, Daniël De ZutterClarendon Press1993
Other Libraries in Japan
  • Subject Heading...ata processing Microwave integrated circuits -- Design -- Data processing Computer-aided design
  • Subject Heading (ID)...ata processing Microwave integrated circuits -- Design -- Data processing Computer-aided design

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