Test structure implementation document [microform] : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory (NIST special publication ; 400-97) (Semiconductor measurement technology)

Test structure implementation document [microform] : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory

(NIST special publication ; 400-97) (Semiconductor measurement technology)

Call No. (NDL): YCA-C 13.10:400-97
Bibliographic ID of National Diet Library: 000006601919

Material type: 図書

Author: Schuster, C. Eほか

Publisher: -

Publication date: 1995

Material Format: Microform

Capacity, size, etc.: microfiche ; 11 × 15 cm

NDC: -

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Note (General)：: Distributed to depository libraries in microficheShipping list no.: 96-0273-M"September 1995."...

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Material Type: 図書
Title: Test structure implementation document [microform] : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory
Series Title: NIST special publication ; 400-97
Semiconductor measurement technology
Author Heading: Schuster, C. E
United States. Defense Advanced Research Projects Agency
Wright Laboratory (Wright-Patterson Air Force Base, Ohio)
National Institute of Standards and Technology (U.S.)
Publication Date (W3CDTF): 1995
Extent: microfiche
Size: 11 × 15 cm
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Microwave integrated circuits -- Design -- Data processing
Gallium arsenide semiconductors -- Design -- Data processing
Computer-aided design
Note (General): Distributed to depository libraries in microfiche
Shipping list no.: 96-0273-M
"September 1995."
Physical description for original version: iv, 88 p. : 28 cm
Note (Bibliography): Includes bibliographical references (p. 14)
Note (Original Version): 原資料の出版事項: Gaithersburg, MD ; Washington : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology : For sale by the Supt. of Docs., U.S. G.P.O., 1995
SUPTDOC番号: C 13.10: 400-97
GPO管理番号: 0247 (MF)
Holding library: 国立国会図書館
Call No.: YCA-C 13.10:400-97
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006601919
http://id.ndl.go.jp/bib/000006601919
OCLC No.: 34871880
https://www.worldcat.org/oclc/34871880
Bibliographic Record Category (NDL): 281