Test structure implementation document [microform] : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory

• 資料種別: 図書
• タイトル: Test structure implementation document [microform] : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory
• シリーズタイトル: NIST special publication ; 400-97; Semiconductor measurement technology
• 著者標目: Schuster, C. E; United States. Defense Advanced Research Projects Agency; Wright Laboratory (Wright-Patterson Air Force Base, Ohio); National Institute of Standards and Technology (U.S.)
• 出版年（W3CDTF）: 1995
• 数量: microfiche
• 大きさ: 11 × 15 cm
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 資料種別（注記）: [microform]
• 件名標目: Microwave integrated circuits -- Design -- Data processing; Gallium arsenide semiconductors -- Design -- Data processing; Computer-aided design
• 一般注記: Distributed to depository libraries in microfiche; Shipping list no.: 96-0273-M; "September 1995."; Physical description for original version: iv, 88 p. : 28 cm
• 書誌注記: Includes bibliographical references (p. 14)
• 原資料等に関する注記: 原資料の出版事項: Gaithersburg, MD ; Washington : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology : For sale by the Supt. of Docs., U.S. G.P.O., 1995; SUPTDOC番号: C 13.10: 400-97; GPO管理番号: 0247 (MF)
• 所蔵機関: 国立国会図書館
• 請求記号: YCA-C 13.10:400-97
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000006601919; http://id.ndl.go.jp/bib/000006601919
• OCLC番号: 34871880; https://www.worldcat.org/oclc/34871880
• 整理区分コード: 281