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Calculation of Sputtering Yield with Obliquely Incident Light-Ions (H+, D+,, T+,, He+,) and its Representation by an Extended Semi-empirical Formula

Calculation of Sputtering Yield with Obliquely Incident Light-Ions (H+, D+,, T+,, He+,) and its Representation by an Extended Semi-empirical Formula
Digital文書・図像類
ONO, Tadayoshi, ONO, M., SHIBATA, K., KENMOTSU, Takahiro, LI, Z., KAWAMURA, TakaichiNational Institute for Fusion Science2012-04-13Research Report NIFS-Series
Other Libraries in Japan
  • Subject HeadingSputtering Erosion Plasma-material interactions First wall materials Fitting ...

Extended Incident-Angle Dependence Formula of Sputter Yield

Extended Incident-Angle Dependence Formula of Sputter Yield
Digital文書・図像類
ONO, Tadayoshi, SHIBATA, K., KENMOTSU, Takahiro, MURAMOTO, T., LI C, Z., KAWAMURA, TakaichiNational Institute for Fusion Science2006-06Research Report NIFS-Series
Other Libraries in Japan

An Extended Formula for the Energy Spectrum of Sputtered Atoms form a Material Irradiated by Light Ions

An Extended Formula for the Energy Spectrum of Sputtered Atoms form a Material Irradiated by Light Ions
Digital文書・図像類
ONO, Tadayoshi, AOKI, Y., KENMOTSU, Takahiro, YAMAMURA, YasunoriNational Institute for Fusion Science2004-10Research Report NIFS-Series
Other Libraries in Japan

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