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Reflection, scattering, and diffraction from surfaces 3 : 13-16 August 2012 : San Diego, California, United States : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8495)

Reflection, scattering, and diffraction from surfaces 3 : 13-16 August 2012 : San Diego, California, United States : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8495)
Paper図書
SPIEc2012.<M17-13-1001>
National Diet Library

Pavement surface condition/performance assessment: reliability and relevancy of procedures and technologies. : ASTM International symposium on pavement condition assessment : Dec 2004, Washington, DC. (STP ; 1486)

Pavement surface condition/performance assessment: reliability and relevancy of procedures and technologies. : ASTM International symposium on pavement condition assessment : Dec 2004, Washington, DC. (STP ; 1486)
Paper図書
ASTM Internationalc2007.<M17-07-1579>
National Diet Library
  • Subject Heading...-- Congresses. Surface roughness -- Measurement -- Congresses.

Reflection, scattering, and diffraction from surfaces : 11-12 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7065)

Reflection, scattering, and diffraction from surfaces : 11-12 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7065)
Paper図書
SPIEc2008.<M17-09-192>
National Diet LibraryOther Libraries in Japan
  • Subject HeadingSurface roughness -- Measurement -- Congresses. Diffractive sc...

Surface scattering and diffraction 3 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5189)

Surface scattering and diffraction 3 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5189)
Paper図書
SPIEc2003.<M17-04-934>
National Diet Library
  • Subject HeadingSurface roughness -- Measurement. -- Congresses. Diffractive s...

Surface scattering and diffraction for advanced metrology 2 : 9 July, 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4780)

Surface scattering and diffraction for advanced metrology 2 : 9 July, 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4780)
Paper図書
SPIEc2002.<M17-03-635>
National Diet Library
  • Subject HeadingSurface roughness -- Measurement. -- Congresses. Diffractive s...

Surface scattering and diffraction for advanced metrology : 1 August 2001 : San Diego, USA. : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4447)

Surface scattering and diffraction for advanced metrology : 1 August 2001 : San Diego, USA. : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4447)
Paper図書
SPIEc2001.<M17-03-4990>
National Diet Library
  • Subject HeadingSurface roughness -- Measurement -- Congresses. Diffractive sc...

Fractal analysis in machining pbk.

Fractal analysis in machining pbk.
Paper図書
Prasanta Sahoo, Tapan Barman, Joõ Paulo DavimSpringerc2011
Other Libraries in Japan
  • Subject HeadingSurface roughness -- Measurement Fractals Machining
  • Subject Heading (ID)Surface roughness -- Measurement Fractals Machining

Introduction to surface roughness and scattering 2nd. ed.

Introduction to surface roughness and scattering 2nd. ed.
Paper図書
Jean M. Bennett, Lars MattssonOptical Society of Americac1999
Other Libraries in Japan
  • Subject HeadingSurface roughness -- Measurement Light -- Scattering
  • Subject Heading (ID)Surface roughness -- Measurement Light -- Scattering

Pavement surface condition/performance assessment : reliability and relevancy of procedures and technologies

Pavement surface condition/performance assessment : reliability and relevancy of procedures and technologies
Paper図書
Bouzid Choubane, editorASTM Internationalc2007
Other Libraries in Japan
  • Subject Heading... -- Congresses Surface roughness -- Measurement -- Congresses
  • Subject Heading (ID)... -- Congresses Surface roughness -- Measurement -- Congresses

Development of methods for the characterisation of roughness in three dimensions Revised reprint

Development of methods for the characterisation of roughness in three dimensions Revised reprint
Paper図書
edited by K.J. StoutPenton Pressc2000
Other Libraries in Japan
  • Subject HeadingSurface roughness -- Measurement -- Methodology
  • Subject Heading (ID)Surface roughness -- Measurement -- Methodology

Introduction to surface roughness and scattering

Introduction to surface roughness and scattering
Paper図書
Jean M. Bennett, Lars MattssonOptical Society of Americac1989
Other Libraries in Japan
  • Subject HeadingSurface roughness -- Measurement Light -- Scattering
  • Subject Heading (ID)Surface roughness -- Measurement Light -- Scattering

Scattering and surface roughness III : 1-2 August 2000, San Diego, USA

Scattering and surface roughness III : 1-2 August 2000, San Diego, USA
Paper図書
Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2000
Other Libraries in Japan
  • Subject HeadingSurface roughness -- Measurement Congresses Light -- Scatterin...
  • Subject Heading (ID)Surface roughness -- Measurement Congresses Light -- Scatterin...

Measurement of pavement surface condition, 1990

Measurement of pavement surface condition, 1990
Paper図書
Transportation Research Board, National Research Council1990
Other Libraries in Japan
  • Subject Heading... -- Management Surface roughness -- Measurement
  • Subject Heading (ID)... -- Management Surface roughness -- Measurement

Scattering and surface roughness II : 21-23 July 1998, San Diego, California

Scattering and surface roughness II : 21-23 July 1998, San Diego, California
Paper図書
Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc1998
Other Libraries in Japan
  • Subject HeadingSurface roughness -- Measurement Congresses Light -- Scatterin...
  • Subject Heading (ID)Surface roughness -- Measurement Congresses Light -- Scatterin...

The international road roughness experiment : establishing correlation and a calibration standard for measurements pbk.

The international road roughness experiment : establishing correlation and a calibration standard for measurements pbk.
Paper図書
Michael W. Sayers, Thomas D. Gillespie, and Cesar A.V. QueirozWorld Bankc1986
Other Libraries in Japan
  • Subject HeadingRoads -- Riding qualities -- Measurement Surface roughness -- Measurement
  • Subject Heading (ID)Roads -- Riding qualities -- Measurement Surface roughness -- Measurement

Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California

Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California
Paper図書
John C. Stover, chair/editorSponsored and published by SPIE-The International Society for Optical Engineeringc1998
Other Libraries in Japan
  • Subject Heading... -- Congresses Surface roughness -- Measurement -- Congresses Flatness measur...
  • Subject Heading (ID)... -- Congresses Surface roughness -- Measurement -- Congresses Flatness measur...

Pavement roughness and skid resistance

Pavement roughness and skid resistance
Paper図書
Transportation Research Board, National Research Council1986
Other Libraries in Japan
  • Subject HeadingRoads -- Riding qualities Surface roughness -- Measurement Pavements -- Skid resistance
  • Subject Heading (ID)Roads -- Riding qualities Surface roughness -- Measurement Pavements -- Skid resistance

Scattering and surface roughness : 30-31 July 1997, San Diego, California

Scattering and surface roughness : 30-31 July 1997, San Diego, California
Paper図書
Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc1997
Other Libraries in Japan
  • Subject HeadingSurface roughness -- Measurement -- Congresses Light -- Scatte...
  • Subject Heading (ID)Surface roughness -- Measurement -- Congresses Light -- Scatte...

Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays : 8-9 August 1996, Denver, Colorado

Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays : 8-9 August 1996, Denver, Colorado
Paper図書
John C. Stover, chair/editorSPIE-The International Society for Optical Engineeringc1996
Other Libraries in Japan
  • Subject Heading... -- Congresses Surface roughness -- Measurement -- Congresses Flatness measur...
  • Subject Heading (ID)... -- Congresses Surface roughness -- Measurement -- Congresses Flatness measur...

Surface measurement and characterization : ECO1 19-21 September, 1988, Hamburg, Federal Republic of Germany

Surface measurement and characterization : ECO1 19-21 September, 1988, Hamburg, Federal Republic of Germany
Paper図書
Jean M. Bennett chair editor ; sponsored by EPS--European Physical Society, Europtica--the European Federation for Applied Optics, SPIE--the International Society for Optical EngineeringSPIE--the International Society for Optical Engineeringc1989
Other Libraries in Japan
  • Subject HeadingSurface roughness -- Measurement -- Congresses Surfaces (Techn...
  • Subject Heading (ID)Surface roughness -- Measurement -- Congresses Surfaces (Techn...
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