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Reflection, scattering, and diffraction from surfaces 3 : 13-16 August 2012 : San Diego, California, United States : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8495)

Reflection, scattering, and diffraction from surfaces 3 : 13-16 August 2012 : San Diego, California, United States : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8495)
Paper図書
SPIEc2012.<M17-13-1001>
National Diet Library
  • Subject HeadingSurface roughness--Measurement--Congresses. Diffractive scattering--Congr...

Pavement surface condition/performance assessment: reliability and relevancy of procedures and technologies. : ASTM International symposium on pavement condition assessment : Dec 2004, Washington, DC. (STP ; 1486)

Pavement surface condition/performance assessment: reliability and relevancy of procedures and technologies. : ASTM International symposium on pavement condition assessment : Dec 2004, Washington, DC. (STP ; 1486)
Paper図書
ASTM Internationalc2007.<M17-07-1579>
National Diet Library

Reflection, scattering, and diffraction from surfaces : 11-12 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7065)

Reflection, scattering, and diffraction from surfaces : 11-12 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7065)
Paper図書
SPIEc2008.<M17-09-192>
National Diet LibraryOther Libraries in Japan

Surface scattering and diffraction 3 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5189)

Surface scattering and diffraction 3 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5189)
Paper図書
SPIEc2003.<M17-04-934>
National Diet Library

Surface scattering and diffraction for advanced metrology 2 : 9 July, 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4780)

Surface scattering and diffraction for advanced metrology 2 : 9 July, 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4780)
Paper図書
SPIEc2002.<M17-03-635>
National Diet Library

Surface scattering and diffraction for advanced metrology : 1 August 2001 : San Diego, USA. : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4447)

Surface scattering and diffraction for advanced metrology : 1 August 2001 : San Diego, USA. : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4447)
Paper図書
SPIEc2001.<M17-03-4990>
National Diet Library

Pavement surface condition/performance assessment : reliability and relevancy of procedures and technologies

Pavement surface condition/performance assessment : reliability and relevancy of procedures and technologies
Paper図書
Bouzid Choubane, editorASTM Internationalc2007
Other Libraries in Japan

Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California

Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California
Paper図書
John C. Stover, chair/editorSponsored and published by SPIE-The International Society for Optical Engineeringc1998
Other Libraries in Japan

Scattering and surface roughness : 30-31 July 1997, San Diego, California

Scattering and surface roughness : 30-31 July 1997, San Diego, California
Paper図書
Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc1997
Other Libraries in Japan

Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays : 8-9 August 1996, Denver, Colorado

Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays : 8-9 August 1996, Denver, Colorado
Paper図書
John C. Stover, chair/editorSPIE-The International Society for Optical Engineeringc1996
Other Libraries in Japan

Surface measurement and characterization : ECO1 19-21 September, 1988, Hamburg, Federal Republic of Germany

Surface measurement and characterization : ECO1 19-21 September, 1988, Hamburg, Federal Republic of Germany
Paper図書
Jean M. Bennett chair editor ; sponsored by EPS--European Physical Society, Europtica--the European Federation for Applied Optics, SPIE--the International Society for Optical EngineeringSPIE--the International Society for Optical Engineeringc1989
Other Libraries in Japan

Metrology : figure and finish : 15-16 January 1987, Los Angeles, California pbk.

Metrology : figure and finish : 15-16 January 1987, Los Angeles, California pbk.
Paper図書
Bruce Truax, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; in cooperation with Center for Applied Optics/University of Alabama in Huntsville ... [et al.]The Societyc1987
Other Libraries in Japan

Measuring road roughness and its effects on user cost and comfort : a symposium

Measuring road roughness and its effects on user cost and comfort : a symposium
Paper図書
sponsored by ASTM Committee E-17 on Traveled Surface Characteristics, Bal Harbour, FL, 7 Dec. 1983 ; Thomas D. Gillespie and Michael Sayers, editorsASTMc1985
Other Libraries in Japan

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