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Studies on defect level and diagnosis for built-in self test architecture

Studies on defect level and diagnosis for built-in self test architecture
Digital博士論文
中村, 芳行Nara Institute of Science and Technology2006-03-24
Other Libraries in Japan
  • Subject Headingbuilt-in self test fault coverage defect level fault diagnosis error identification at-speed test

Studies on test generation and design for testability based on knowledge for LSIs

Studies on test generation and design for testability based on knowledge for LSIs
Digital博士論文
中里, 昌人Nara Institute of Science and Technology2007-03-23
Other Libraries in Japan
  • Subject Heading...test knowledge at-speed testing

Instruction-based self-testing of performance oriented faults in modern processors

Instruction-based self-testing of performance oriented faults in modern processors
Digital博士論文
Singh, VirendraNara Institute of Science and Technology2005-09-30
Other Libraries in Japan
  • Subject Heading...g VLSI testing at-speed testing Performance oriented fault...

Studies on Design for Delay Testability and Delay Test Generation for Sequential Circuits

Studies on Design for Delay Testability and Delay Test Generation for Sequential Circuits
Digital博士論文
岩垣, 剛Nara Institute of Science and Technology2004-09-30
Other Libraries in Japan
  • Subject Heading...on-scan design at-speed test

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