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Defects in high-k gate dielectric stacks : nano-electronic semiconductor devices. : NATO advanced research workshop on defects in advanced high-k dielectric nano-electronic semiconductor devices : DeHik'2005 : Jul 2005, St. Petersburg, Russia. (NATO Science Series. Series II, Mathematics, Physics and Chemistry ; 220)

Defects in high-k gate dielectric stacks : nano-electronic semiconductor devices. : NATO advanced research workshop on defects in advanced high-k dielectric nano-electronic semiconductor devices : DeHik'2005 : Jul 2005, St. Petersburg, Russia. (NATO Science Series. Series II, Mathematics, Physics and Chemistry ; 220)
Paper図書
Springerc2006.<M17-06-711>
National Diet Library

Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices : pbk

Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices : pbk
Paper図書
edited by Evgeni GusevSpringerc2006
Other Libraries in Japan

NATO science series

NATO science series
Paper図書
Kluwer Academic Publishers
Other Libraries in Japan
  • Related Material...anging systems Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices Emerging technologies and tec...

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