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Data analysis and modeling for process control III : 23 February, 2006, San Jose, California, USA

Data analysis and modeling for process control III : 23 February, 2006, San Jose, California, USA
紙図書
Iraj Emami, Kenneth W. Tobin, Jr. ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, SEMATECH, IncSPIEc2006
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  • 著者標目Data Analysis and Modeling for Process Control (Conference) Emami, Iraj Tobin, Kenneth W....

Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA

Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA
紙図書
Iraj Emami, chair/editor ; Christopher P. Ausschnitt, Kenneth W. Tobin, Jr., cochair/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organization, International SEMATECH ; published by SPIE--the International Society for Optical EngineeringSPIEc2005
全国の図書館
  • 著者標目Data Analysis and Modeling for Process Control (Conference) Emami, Iraj Ausschnitt, Chris...

Data analysis and modeling for process control : 26-27 February 2004, Santa Clara, California, USA

Data analysis and modeling for process control : 26-27 February 2004, Santa Clara, California, USA
紙図書
Kenneth W. Tobin, Jr., chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International [and] International SEMATECHSPIEc2004
全国の図書館
  • 著者標目Data Analysis and Modeling for Process Control (Conference) Tobin, Kenneth W. Society of ...

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