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Optical radiation measurement with selected detectors and matched electronic circuits between 200 nm and 20 [mu]m [microform] / George P. Eppeldauer, editor (NIST technical note ; 1438)

Optical radiation measurement with selected detectors and matched electronic circuits between 200 nm and 20 [mu]m [microform] / George P. Eppeldauer, editor (NIST technical note ; 1438)
マイクロ図書
2001<YCA-C 13.46:1438>
国立国会図書館
  • 著者標目Eppeldauer, George P National Institute of Standar...

Spectroradiometric detector measurements. Part III, Infrared detectors [microform] / Alan L. Migdall and George P. Eppeldauer (NIST special publication ; 250-42. NIST measurement services)

Spectroradiometric detector measurements. Part III, Infrared detectors [microform] / Alan L. Migdall and George P. Eppeldauer (NIST special publication ; 250-42. NIST measurement services)
マイクロ図書
1998<YCA-C 13.10:250-42>
国立国会図書館
  • 著者標目Migdall, Alan L Eppeldauer, George P National Institute of Standar...

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