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Sandia programs relevant to microelectronics fabrication (SAND ; SAND-87-0890; DE87010538)

Sandia programs relevant to microelectronics fabrication (SAND ; SAND-87-0890; DE87010538)
紙図書
Picraux, S.T., Vook, F.L., Gregory, B.L.Sandia National Labs.1987.4.
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  • 著者標目Picraux, S.T. Vook, F.L. Gregory, B.L.

PROCESS CONTROLS FOR RADIATION HARDENED ALUMINUM GATE BULK SILICON CMOS. (SAND ; SAND-75-5607)

PROCESS CONTROLS FOR RADIATION HARDENED ALUMINUM GATE BULK SILICON CMOS. (SAND ; SAND-75-5607)
紙図書
GREGORY, B.L.Sandia National Laboratories(Sandia National Laboratories)1975.
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  • 著者標目GREGORY, B.L.

Latch-up in CMOS integrated circuits (SLA ; SLA-73-5613) (CONF ; CONF-730703-8)

Latch-up in CMOS integrated circuits (SLA ; SLA-73-5613) (CONF ; CONF-730703-8)
紙図書
B.L. Gregory, B.D. ShaferSandia Labs.1973.7.
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  • 著者標目Gregory, B.L. Shafer, B.D.

Transient annealing in semiconductor devices following pulsed neutron irradiation (SC ; SC-DC-66-1820; CONF-660705-1)

Transient annealing in semiconductor devices following pulsed neutron irradiation (SC ; SC-DC-66-1820; CONF-660705-1)
紙図書
Sander, H.H., Gregory, B.L.Sandia Corp.1966.7.
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  • 著者標目Sander, H.H. Gregory, B.L.

TRANSIENT ANNEALING OF EFFECTS IN IRRADIATED SILICON DEVICES. (SC ; SC-RR-70-397)

TRANSIENT ANNEALING OF EFFECTS IN IRRADIATED SILICON DEVICES. (SC ; SC-RR-70-397)
紙図書
GREGORY, B.L.
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  • 著者標目GREGORY, B.L.

RADIATION HARDENING TECHNOLOGY. (SLA ; SLA-74-5349)

RADIATION HARDENING TECHNOLOGY. (SLA ; SLA-74-5349)
紙図書
GREGORY, B.L.
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  • 著者標目GREGORY, B.L.

DESIGN REQUIREMENTS FOR RADIATION HARDENED SEMICONDUCTOR DEVICES. (SLA ; SLA-74-5243)

DESIGN REQUIREMENTS FOR RADIATION HARDENED SEMICONDUCTOR DEVICES. (SLA ; SLA-74-5243)
紙図書
GREGORY, B.L.
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  • 著者標目GREGORY, B.L.

NEUTRON-PRODUCED TRAPPING CENTERS IN JUNCTION FIELD-EFFECT TRANSISTORS. (SC ; SC-DC-713707)

NEUTRON-PRODUCED TRAPPING CENTERS IN JUNCTION FIELD-EFFECT TRANSISTORS. (SC ; SC-DC-713707)
紙図書
GREGORY, B.L.
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  • 著者標目GREGORY, B.L.

RADIATION EFFECTS ON MICROELECTRONICS. (SLA ; SLA-73-5731)

RADIATION EFFECTS ON MICROELECTRONICS. (SLA ; SLA-73-5731)
紙図書
GREGORY, B.L.
全国の図書館
  • 著者標目GREGORY, B.L.

NEUTRON DAMAGE ANNEALING IN SILICON N-CHANNEL JUNCTION FIELD EFFECT TRANSISTORS. (SC ; SC-RR-710744)

NEUTRON DAMAGE ANNEALING IN SILICON N-CHANNEL JUNCTION FIELD EFFECT TRANSISTORS. (SC ; SC-RR-710744)
紙図書
GREGORY, B.L.
全国の図書館
  • 著者標目GREGORY, B.L.

LATCH-UP STUDIES IN SILICON CMOS INTEGRATED CIRCUITS. (SLA ; SLA-73-5286)

LATCH-UP STUDIES IN SILICON CMOS INTEGRATED CIRCUITS. (SLA ; SLA-73-5286)
紙図書
GREGORY, B.L.
全国の図書館
  • 著者標目GREGORY, B.L.

MINORITY CARRIER RECOMBINATION IN NEUTRON IRRADIATED SILICON. (SC ; SC-DC-69-1703)

MINORITY CARRIER RECOMBINATION IN NEUTRON IRRADIATED SILICON. (SC ; SC-DC-69-1703)
紙図書
GREGORY, B.L.
全国の図書館
  • 著者標目GREGORY, B.L.

APPLICATION OF NEUTRON DAMAGE MODELS TO SEMICONDUCTOR DEVICE STUDIES. (SC ; SC-R-70-4351)

APPLICATION OF NEUTRON DAMAGE MODELS TO SEMICONDUCTOR DEVICE STUDIES. (SC ; SC-R-70-4351)
紙図書
GREGORY, B.L.
全国の図書館
  • 著者標目GREGORY, B.L.

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