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Dimensional optical metrology and inspection for practical applications 2 : 25-26 August 2013 : San Diego, California, United States : 2013 conference on dimensional optical metrology and inspection for practical applications : Aug 2013, San Diego, CA. (SPIE Proceedings ; 8839)

Dimensional optical metrology and inspection for practical applications 2 : 25-26 August 2013 : San Diego, California, United States : 2013 conference on dimensional optical metrology and inspection for practical applications : Aug 2013, San Diego, CA. (SPIE Proceedings ; 8839)
紙図書
SPIEc2013.<M17-14-1500>
国立国会図書館
  • 著者標目Harding, Kevin G. Huang, Peisen S. Yoshizawa, Tōru, 1939-

Optical metrology and inspection for industrial applications 2 : 5-7 November 2012 : Beijing, China : conference on optical metrology and inspection for industrial applications 2 : Nov 2012, Beijing, China. (SPIE Proceedings ; 8563)

Optical metrology and inspection for industrial applications 2 : 5-7 November 2012 : Beijing, China : conference on optical metrology and inspection for industrial applications 2 : Nov 2012, Beijing, China. (SPIE Proceedings ; 8563)
紙図書
SPIEc2012.<M17-13-2507>
国立国会図書館
  • 著者標目Harding, Kevin G. Huang, Peisen S. Yoshizawa, Tōru, 1939- Tsingh...

Dimensional optical metrology and inspection for practical applications : 22-23 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8133)

Dimensional optical metrology and inspection for practical applications : 22-23 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8133)
紙図書
SPIEc2011.<M17-12-2008>
国立国会図書館
  • 著者標目Harding, Kevin G. Huang, Peisen S. Yoshizawa, Tōru, 1939-

Optical inspection and metrology for non-optics industries : 3-4 August 2009 : San Diego, California, United States. : Aug 2009, San Diego, CA. (SPIE Proceedings ; 7432)

Optical inspection and metrology for non-optics industries : 3-4 August 2009 : San Diego, California, United States. : Aug 2009, San Diego, CA. (SPIE Proceedings ; 7432)
紙図書
SPIEc2009.<M17-10-1287>
国立国会図書館
  • 著者標目Huang, Peisen S. Yoshizawa, Tōru, 1939- Hardin...

Two- and three-dimensional methods for inspection and metrology 5 : 11-12 September 2007 : Boston, Massachusetts, USA. (SPIE Proceedings ; 6762)

Two- and three-dimensional methods for inspection and metrology 5 : 11-12 September 2007 : Boston, Massachusetts, USA. (SPIE Proceedings ; 6762)
紙図書
SPIEc2007.<M17-08-398>
国立国会図書館全国の図書館
  • 著者標目Huang, Peisen S.

Two- and three-dimensional methods for inspection and metrology 6 : 10-11 August 2008 : San Diego, California, USA. (SPIE Proceedings ; 7066)

Two- and three-dimensional methods for inspection and metrology 6 : 10-11 August 2008 : San Diego, California, USA. (SPIE Proceedings ; 7066)
紙図書
SPIEc2008.<M17-09-193>
国立国会図書館全国の図書館
  • 著者標目Huang, Peisen S. Yoshizawa, Tōru, 1939- Hardin...

Two- and three-dimensional methods for inspection and metrology 4 : 1-3 October 2006 : Boston, Massachusetts, USA. (SPIE Proceedings ; 6382)

Two- and three-dimensional methods for inspection and metrology 4 : 1-3 October 2006 : Boston, Massachusetts, USA. (SPIE Proceedings ; 6382)
紙図書
SPIEc2006.<M17-07-245>
国立国会図書館
  • 著者標目Huang, Peisen S.

Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA

Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA
紙図書
Peisen S. Huang, chair/editor ; sponsored and published by by SPIE--the International Society for Optical EngineeringSPIEc2006
全国の図書館
  • 著者標目... and metrology Huang, Peisen S. Society of Photo-optical Inst...

検索結果は以上です。

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