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検索結果 8 件

1997 IEEE International Reliability Physics Symposium proceedings : 35th annual, Denver, Colorado, April 8, 9, 10, 1997 : soft. : case.

1997 IEEE International Reliability Physics Symposium proceedings : 35th annual, Denver, Colorado, April 8, 9, 10, 1997 : soft. : case.
紙図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability SocietyInstitute of Electrical and Electronics Engineers, c19971997
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  • 著者標目IEEE International Reliability and Physics Symposium IEEE Electron Devices Society...

1996 IEEE International Reliability Physics Proceedings : 34th annual, Dallas, Texas, April 30, May 1, 2, 1996 : soft. : case. : micro.

1996 IEEE International Reliability Physics Proceedings : 34th annual, Dallas, Texas, April 30, May 1, 2, 1996 : soft. : case. : micro.
紙図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability SocietyInstitute of Electrical and Electronics Engineers, c19961996
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  • 著者標目IEEE International Reliability and Physics Symposium IEEE Electron Devices Society...

1995 IEEE International Reliability Physics Proceedings : 33rd annual, Las Vegas, Nevada, April 4, 5, 6, 1995 : soft. : case. : micro.

1995 IEEE International Reliability Physics Proceedings : 33rd annual, Las Vegas, Nevada, April 4, 5, 6, 1995 : soft. : case. : micro.
紙図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability SocietyInstitute of Electrical and Electronics Engineers, c19951995
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  • 著者標目IEEE International Reliability and Physics Symposium IEEE Electron Devices Society...

1994 IEEE International Reliability Physics Proceedings : 32nd annual, San Jose, California, April 12, 13, 14, 1994 : soft. : case. : micro.

1994 IEEE International Reliability Physics Proceedings : 32nd annual, San Jose, California, April 12, 13, 14, 1994 : soft. : case. : micro.
紙図書
sponsored by the IEEE Electron Devices Society and the IEEE ReliabilityInstitute of Electrical and Electronics Engineers, c19941994
全国の図書館
  • 著者標目IEEE International Reliability and Physics Symposium IEEE Electron Devices Society...

31st Annual Proceedings : Reliability Physics 1993, Atlanta, Georgia, March 23, 24, 25, 1993 : soft. : case. : micro.

31st Annual Proceedings : Reliability Physics 1993, Atlanta, Georgia, March 23, 24, 25, 1993 : soft. : case. : micro.
紙図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability SocietyElectron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineersc1993
全国の図書館
  • 著者標目IEEE International Reliability and Physics Symposium IEEE Electron Devices Society...

30th Annual Proceedings : Reliability Physics 1992, San Diego, California, March 31, April 1, 2, 1992 : soft : case : micro

30th Annual Proceedings : Reliability Physics 1992, San Diego, California, March 31, April 1, 2, 1992 : soft : case : micro
紙図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability SocietyElectron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineersc1992
全国の図書館
  • 著者標目IEEE International Reliability and Physics Symposium IEEE Electron Devices Society...

29th annual proceedings : Reliability Physics 1991, Las Vegas, Nevada, April 9, 10, 11, 1991 : soft. : hard. : micro.

29th annual proceedings : Reliability Physics 1991, Las Vegas, Nevada, April 9, 10, 11, 1991 : soft. : hard. : micro.
紙図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability SocietyElectron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineersc1991
全国の図書館
  • 著者標目IEEE International Reliability and Physics Symposium IEEE Electron Devices Society...

28th Annual Proceedings : Reliability Physics 1990, New Orleans, Louisiana, March 27,28,29, 1990

28th Annual Proceedings : Reliability Physics 1990, New Orleans, Louisiana, March 27,28,29, 1990
紙図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability SocietyElectron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers, c19901990
全国の図書館
  • 著者標目IEEE International Reliability and Physics Symposium IEEE Electron Devices Society...

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