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2011 sixth IEEE international symposium on electronic design, test and application : (DELTA 2011) : Queenstown, New Zealand : 17-19 January 2011.

2011 sixth IEEE international symposium on electronic design, test and application : (DELTA 2011) : Queenstown, New Zealand : 17-19 January 2011.
紙図書
IEEEc2011.<M17-12-1378>
国立国会図書館
  • 著者標目IEEE International Symposium on Electronic Design, Test and Applications (6th : 2011 : Queenstown, N.Z...

2010 fifth IEEE international symposium on electronic design, test & applications : (DELTA 2010) : Ho Chi Minh City, Vietnam : 13-15 January 2010.

2010 fifth IEEE international symposium on electronic design, test & applications : (DELTA 2010) : Ho Chi Minh City, Vietnam : 13-15 January 2010.
紙図書
IEEEc2010.<M17-11-1502>
国立国会図書館
  • 並列タイトル等（連結）2010 5th IEEE international symposium on electronic design, test and applications : (DELTA 2010) : Ho Chi Minh ...
  • 並列タイトル等2010 5th IEEE international symposium on electronic design, test and applications : (DELTA 2010) : Ho Chi Minh ...
  • 著者標目IEEE International Symposium on Electronic Design, Test and Applications (5th : 2010 : Ho Chi Minh Cit...

Proceedings : fourth IEEE International Symposium on Electronic Design, Test, and Applications, 23-25 January 2008, Hong Kong, SAR, China

Proceedings : fourth IEEE International Symposium on Electronic Design, Test, and Applications, 23-25 January 2008, Hong Kong, SAR, China
紙図書
editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and TechnologyIEEE Computer Societyc2008
全国の図書館
  • 著者標目IEEE International Symposium on Electronic Design, Test and Applications Osseiran, Adam IEEE Computer ...

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