edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of SingaporeInstitute of Electrical and Electronics Engineersc2002
全国の図書館
- 一般注記... Chim Wai Kin, Lee Kheng Chooi
- 著者標目... Chim, Wai Kin Lee, Kheng Chooi