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検索結果 3 件

Machine vision applications in industrial inspection 12 : 21-22 January 2004 : San Jose, California, USA. : Jan 2004, San Jose, CA. (SPIE Proceedings ; 5303)

Machine vision applications in industrial inspection 12 : 21-22 January 2004 : San Jose, California, USA. : Jan 2004, San Jose, CA. (SPIE Proceedings ; 5303)
紙図書
SPIEc2004.<M17-04-2557>
国立国会図書館全国の図書館
  • 著者標目Price, Jeffery R. Mériaudeau, Fabrice.

Machine vision applications in industrial inspection 11 : 22-24 January 2003 : Santa Clara, California, USA. : Jan 2003, Santa Clara, CA. (SPIE Proceedings ; 5011)

Machine vision applications in industrial inspection 11 : 22-24 January 2003 : Santa Clara, California, USA. : Jan 2003, Santa Clara, CA. (SPIE Proceedings ; 5011)
紙図書
SPIEc2003.<M17-03-5242>
国立国会図書館
  • 著者標目Hunt, Martin A. (Martin Anthony) , 1963- Price, Jeffery R.

Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA

Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA
紙図書
Martin A. Hunt, Jeffery R. Price, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc2003
全国の図書館
  • 著者標目Hunt, Martin A. Price, Jeffery R. IS & T--the Society for Imagi...

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