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CASE HISTORY: FAILURE ANALYSIS OF A CMOS SRAM WITH AN INTERMITTENT OPEN CONTACT (SAND ; SAND-91-0741C)

CASE HISTORY: FAILURE ANALYSIS OF A CMOS SRAM WITH AN INTERMITTENT OPEN CONTACT (SAND ; SAND-91-0741C)
紙図書
CAMPBELL, A.N.// COLE, E.I. JR.// HENDERSON, C.L.// TAYLOR, M.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1991.
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  • 著者標目CAMPBELL, A.N. COLE, E.I. JR. HENDERSON, C.L. TAYLOR, M.R.

Electrical measurements for CMOS IC stuck-open faults (SAND ; SAND-88-3442C; CONF-890846-1; DE89005924)

Electrical measurements for CMOS IC stuck-open faults (SAND ; SAND-88-3442C; CONF-890846-1; DE89005924)
紙図書
Soden, J.M., Treece, R.K., Taylor, M.R. [et al.]Sandia National Labs.1989.1.
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  • 著者標目Soden, J.M. Treece, R.K. Taylor, M.R. Hawkins, C.F.

Crystallographic computing 4 : techniques and new technologies : papers presented at the International School of Crystallographic Computing held at the Flinders University of South Australia, Adelaide, Australia, August 22-29, 1987

Crystallographic computing 4 : techniques and new technologies : papers presented at the International School of Crystallographic Computing held at the Flinders University of South Australia, Adelaide, Australia, August 22-29, 1987
紙図書
edited by N.W. Isaacs and M.R. TaylorInternational Union of Crystallography1988
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