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STRUCTURAL CHARACTERIZATION OF SEMICONDUCTOR HETEROSTRUCTURES BY ATOMIC RESOLUTION Z-CONTRAST IMAGING AT 300KV (CONF ; CONF-931108-68)

STRUCTURAL CHARACTERIZATION OF SEMICONDUCTOR HETEROSTRUCTURES BY ATOMIC RESOLUTION Z-CONTRAST IMAGING AT 300KV (CONF ; CONF-931108-68)
紙図書
MCGIBBON, A.J.// PENNYCOOK, S.J.// WASILEWSKI, Z. (OAK RIDGE NATIONAL LAB., TN (UNITED STATES))1993.
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  • 著者標目MCGIBBON, A.J. PENNYCOOK, S.J. WASILEWSKI, Z.

MBE-XV : International Conference on Molecular Beam Epitaxy, 3-8 August 2008, Vancouver, Canada

MBE-XV : International Conference on Molecular Beam Epitaxy, 3-8 August 2008, Vancouver, Canada
紙図書
eds.: Z.R. Wasilewski, et al.Elsevier2009
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  • 著者標目Wasilewski, Z.R. International Conference on...

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