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検索結果 3 件

Electronic design automation : synthesis, verification, and test

Electronic design automation : synthesis, verification, and test
紙図書
edited by Laung-Terng Wang, Yao-Wen Chang, Kwang-Ting (Tim) ChengMorgan Kaufmann/Elsevierc2009
全国の図書館
  • 著者標目Wang, Laung-Terng Chang, Yao-Wen Cheng, Kwang-T...

System-on-chip test architectures : nanometer design for testability

System-on-chip test architectures : nanometer design for testability
紙図書
edited by Laung-Terng Wang, Charles E. Stroud, Nur A. ToubaMorgan Kaufmann Pub.c2008
全国の図書館
  • 著者標目Wang, Laung-Terng Stroud, Charles E. Touba, Nur

VLSI test principles and architectures : design for testability

VLSI test principles and architectures : design for testability
紙図書
edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing WenElsevier Morgan Kaufmann Publishers2006
全国の図書館
  • 著者標目Wang, Laung-Terng Wu, Cheng-Wen, EE Ph. D. Wen,...

検索結果は以上です。