Fran Cverna, coordinating editor, Patricia Conti, associate editor, contributors, Taehyung Kim [and others], prepared under the direction of the ASM International Materials Properties Database Committee.ASM International[2006]<M361-D7>
prepared under the direction of the ASM International Materials Properties Database Committee ; William C. Mack, coordinating editor ; Charles Moosbrugger, technical editor ...ASM Internationalc2000