「"Electronic apparatus and appliances--Protection--Congresses."」の検索結果 | NDLサーチ

検索結果 17 件

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2013 35th electrical overstress/electrostatic discharge symposium : (EOS/ESD 2013) : Las Vegas, Nevada, USA : 10-12 September 2013 : Sep 2013, Las Vegas, NV.

紙図書

IEEEc2013.<M17-14-1634>

国立国会図書館

件名Electronic apparatus and appliances--Protection--Congresses. Electric discharges--Congress...

Electrical overstress/electrostatic discharge symposium proceedings 2012 : (EOS/ESD 2012) : Tucson, Arizona, USA : 9-14 September 2012 : 34th international EOS/ESD symposium : Sep 2012, Tucson, AZ.

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IEEEc2012.<M17-13-1751>

国立国会図書館

件名Electronic apparatus and appliances--Protection--Congresses. Electric discharges--Congress...

2015 37th electrical overstress/electrostatic discharge symposium (EOS/ESD 2015) : Reno, Nevada, USA : 27 September-2 October 2015 : Sep 2015, Reno, NV.

紙図書

IEEE[2015]<M17-17-733>

国立国会図書館

件名Electronic apparatus and appliances--Protection--Congresses. Electric discharges--Congress...

2014 36th electrical overstress/electrostatic discharge symposium : (EOS/ESD 2014) : Tucson, Arizona, USA : 7-12 September 2014 : 36th international EOS/ESD symposium : Sep 2014, Tucson, AZ.

紙図書

IEEE[2014]<M17-15-2756>

国立国会図書館

件名Electronic apparatus and appliances--Protection--Congresses. Electric discharges--Congress...

Electrical overstress/electrostatic discharge symposium proceedings : 2009 : Anaheim, California, USA : August 30-September 4, 2009. : 31st EOS/ESD symposium : Aug 2009, Anaheim, CA.

紙図書

ESD Associationc2009.<M17-10-947>

国立国会図書館

Electrical Overstress/Electrostatic Discharge Symposium proceedings : Denver, Colorado, September 24-27, 1979 / sponsored by IIT Research Institute.

紙図書

Reliability Analysis Center, Rome Air Development Centerc1980.<ND416-52>

国立国会図書館

Electrical Overstress/Electrostatic Discharge Symposium proceedings, 2000, Anaheim, California, September 26-28, 2000

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sponsored by the ESD Association in corporation with IEEE ; technically co-sponsored by the Electron Devices Society ; co-sponsored by The IPCESD Associationc2000

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Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1998, Reno, Nevada, October 6-8, 1998

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Sponsored by the ESD Association in cooperation with IEEE ; thechnically co-sponsored by the Electron Devices SocietyESD Associationc1998

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Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1997, Santa Clara, California, September 23-25, 1997

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sponsored by the ESD Association in corporation with IEEE ; technically co-sponsored by the Electron Devices SocietyESD Associationc1997

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Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1996, Orlando, Florida, September 10-12, 1996

紙図書

sponsored by the ESD Association in corporation with IEEE ; technically co-sponsored by the Electron Devices SocietyESD Associationc1996

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Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1995, Phoenix, Arizona, September 12-14, 1995

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sponsored by the ESD Association in corporation with IEEE ; technically co-sponsored by the Electron Devices SocietyESD Associationc1995

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Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1994, Las Vegas, Nevada, September 27-29, 1994

紙図書

sponsored by the ESD Association in corporation with IEEEESD Associationc1994

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Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1993, Lake Buena Vista, Florida, September 28-30, 1993

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sponsored by the EOS/ESD Association in corporation with IEEEEOS/ESD Associationc1993

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Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1992, Dallas, Texas, September 16-18, 1992

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sponsored by the EOS/ESD Association in corporation with IEEEEOS/ESD Associationc1992

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Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1991, Las Vegas, Nevada September 24-26, 1991

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sponsored by the EOS/ESD Association in corporation with IEEEEOS/ESD Associationc1991

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Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1988, Anaheim, Calfornia, September 27-29, 1988

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sponsored by the EOS/ESD Association and IIT Research InstituteThe Associationc1988

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Current trends in protective packaging of computers and electronic components pbk.

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Robert J. Peache and Denis O'Sullivan, editorsASTMc1988

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