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Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins. (Materials Research Society symposia proceedings ; v. 46)

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins. (Materials Research Society symposia proceedings ; v. 46)
紙図書
Materials Research Societyc1985.<M15-A4582>
国立国会図書館全国の図書館
  • 件名Semiconductors -- Defects -- Congresses. Microscope and microscopy -- Congresses.

Microscopy of semiconducting materials, 1981 : proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 6-10 April 1981 / Edited by A. G. Cullis and D. C. Joy. (Conference series ; no. 60)

Microscopy of semiconducting materials, 1981 : proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 6-10 April 1981 / Edited by A. G. Cullis and D. C. Joy. (Conference series ; no. 60)
紙図書
The Institute of Physicsc1981.<MC151-48>
国立国会図書館
  • 件名Semiconductors -- Congresses. Microscope and microscopy -- Congresses.

Micro 90 : proceedings of the Royal Microscopical Society Conference, held in London, 2-6 July 1990

Micro 90 : proceedings of the Royal Microscopical Society Conference, held in London, 2-6 July 1990
紙図書
edited by H.Y. ElderA. Hilgerc1990
全国の図書館
  • 件名Microscope and microscopy -- Congresses Microscope and microscopy -- ...
  • 件名（識別子）Microscope and microscopy -- Congresses Microscope and microscopy -- ...

Advances in microscopy : proceedings of the American Microscopical Society Symposium, held in Philadelphia, Pennsylvania, December 28, 1983

Advances in microscopy : proceedings of the American Microscopical Society Symposium, held in Philadelphia, Pennsylvania, December 28, 1983
紙図書
editors, Ronald R. Cowden, Frederick W. HarrisonA.R. Lissc1985
全国の図書館
  • 件名Microscope and microscopy -- Congresses
  • 件名（識別子）Microscope and microscopy -- Congresses

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.
紙図書
editors, Noble M. Johnson, Stephen G. Bishop, George D. WatkinsMaterials Research Societyc1985
全国の図書館
  • 件名Semiconductors -- Defects -- Congresses Microscope and microscopy -- Congresses
  • 件名（識別子）Semiconductors -- Defects -- Congresses Microscope and microscopy -- Congresses

Quantitative electron microscopy : Proceedings of a symposium on "Quantitative electron microscopy" held at the armed forces institute of pathology, Washington, D. C , march 30 through April 3, 1964

Quantitative electron microscopy : Proceedings of a symposium on "Quantitative electron microscopy" held at the armed forces institute of pathology, Washington, D. C , march 30 through April 3, 1964
紙図書
sponsored jointly by the Intersociety Committee for Research Potential in Pathology, Inc. and the Armed Forces Institute of Pathology ; organized and edited by Gunter F. Bahr and Elmar H. Zeitler[s.n.][19--]
全国の図書館
  • 件名Electron microscopy -- Congress Microscope and microscopy -- Congresses Electron microscopy
  • 件名（識別子）Electron microscopy -- Congress Microscope and microscopy -- Congresses Electron microscopy

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