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Sensors, sampling, and simulation for process control : proceedings of a symposium sponsored by (...) : held during the TMS 2011 annual meeting & exhibition : San Diego, California, USA : February 27-March 3, 2011 : TMS2011 : Feb 2011, San Diego, CA.

Sensors, sampling, and simulation for process control : proceedings of a symposium sponsored by (...) : held during the TMS 2011 annual meeting & exhibition : San Diego, California, USA : February 27-March 3, 2011 : TMS2011 : Feb 2011, San Diego, CA.
紙図書
John Wiley & Sonsc2011.<M17-12-190>
国立国会図書館
  • 件名Process control--Mathematical models--Congresses. Detectors--Industrial applica...

Papers presented at 1st international conference on industrial processes for nano and micro products : 3-4 April 2007: London, UK. : Apr 2007, London, UK. (Transferring Technology)

Papers presented at 1st international conference on industrial processes for nano and micro products : 3-4 April 2007: London, UK. : Apr 2007, London, UK. (Transferring Technology)
紙図書
BHR Group[c2007]<M17-07-1106>
国立国会図書館

Data analysis and modeling for process control 3 : 23 February 2006 : San Jose, California, USA. : Feb 2006, San Jose, CA. (SPIE Proceedings ; 6155)

Data analysis and modeling for process control 3 : 23 February 2006 : San Jose, California, USA. : Feb 2006, San Jose, CA. (SPIE Proceedings ; 6155)
紙図書
SPIEc2006.<M17-06-1867>
国立国会図書館

Data analysis and modeling for process control : 26-27 February 2004 : Santa Clara, California, USA. : Feb 2004, Santa Clara, CA. (SPIE Proceedings ; 5378)

Data analysis and modeling for process control : 26-27 February 2004 : Santa Clara, California, USA. : Feb 2004, Santa Clara, CA. (SPIE Proceedings ; 5378)
紙図書
SPIEc2004.<M17-04-2627>
国立国会図書館

Data analysis and modeling for process control III : 23 February, 2006, San Jose, California, USA

Data analysis and modeling for process control III : 23 February, 2006, San Jose, California, USA
紙図書
Iraj Emami, Kenneth W. Tobin, Jr. ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, SEMATECH, IncSPIEc2006
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Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA

Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA
紙図書
Iraj Emami, chair/editor ; Christopher P. Ausschnitt, Kenneth W. Tobin, Jr., cochair/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organization, International SEMATECH ; published by SPIE--the International Society for Optical EngineeringSPIEc2005
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Data analysis and modeling for process control : 26-27 February 2004, Santa Clara, California, USA

Data analysis and modeling for process control : 26-27 February 2004, Santa Clara, California, USA
紙図書
Kenneth W. Tobin, Jr., chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International [and] International SEMATECHSPIEc2004
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Conference on Industrial Applications of Dynamic Modelling, held at the University of Durham, 16-18 September 1969. (I. E. E. conference publication no. 57)

Conference on Industrial Applications of Dynamic Modelling, held at the University of Durham, 16-18 September 1969. (I. E. E. conference publication no. 57)
紙図書
Institution of Electrical Engineers1969.<M281-1>
国立国会図書館

Intelligent processing of materials : presented at the Winter Annual Meeting of the American Society of Mechanical Engineers, Dallas, Texas, November 25-30, 1990

Intelligent processing of materials : presented at the Winter Annual Meeting of the American Society of Mechanical Engineers, Dallas, Texas, November 25-30, 1990
紙図書
sponsored by the Materials Division, ASME ; edited by H.P. WangASMEc1990
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Intelligent processing of materials and advanced sensors : proceedings of a symposium sponsored by the Flow and Fracture and the Electrical, Magnetic, and Optical committees, (ASM), held during the Fall ASM-TMS meeting in Orlando, Florida, 1986

Intelligent processing of materials and advanced sensors : proceedings of a symposium sponsored by the Flow and Fracture and the Electrical, Magnetic, and Optical committees, (ASM), held during the Fall ASM-TMS meeting in Orlando, Florida, 1986
紙図書
edited by H.N.G. Wadley ... [et al.]Metallurgical Societyc1987
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