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Absolute specular reflectometer with an autocollimator telescope and auxiliary mirrors microform / Tie Ming Wang, Kenneth L. Eckerle, Jack J. Hsia (NIST technical note ; 1280)

Absolute specular reflectometer with an autocollimator telescope and auxiliary mirrors microform / Tie Ming Wang, Kenneth L. Eckerle, Jack J. Hsia (NIST technical note ; 1280)
マイクロ図書
1990<YCA-C 13.46:1280>
国立国会図書館
  • 件名Specular reflectance -- Measurement Reflecting telescopes -- Cali...

Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films / A. W. Czanderna, SERI, H. Helbig, Clarkson College of Technology, E. T. Prince, Clarkson College of Technology. (SERI/TP ; 31-064)

Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films / A. W. Czanderna, SERI, H. Helbig, Clarkson College of Technology, E. T. Prince, Clarkson College of Technology. (SERI/TP ; 31-064)
紙図書
Dept. of Energy, Divison of Solar Technology1979.<M191-60>
国立国会図書館
  • 件名...- Measurement. Specular reflectance -- Measurement. Mass (Physics) -- Measuremen...

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