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Novel photon detection based on electronically-induced stress in silicon ORNLCP97596 DE98 004901

Novel photon detection based on electronically-induced stress in silicon ORNLCP97596 DE98 004901
マイクロ規格・テクニカルリポート類
Datskos, P. G, Rajic, S, Egert, C. M, Datskou, I1998<LS-DE98/004901>
国立国会図書館

NOVEL PHOTON DETECTION BASED ON ELECTRONICALLY-INDUCED STRESS IN SILICON. (ORNL ; ORNL/CP-97596; DE98004901)

NOVEL PHOTON DETECTION BASED ON ELECTRONICALLY-INDUCED STRESS IN SILICON. (ORNL ; ORNL/CP-97596; DE98004901)
紙図書
DATSKOS, P.G.(et al.)Oak Ridge National Laboratory(Oak Ridge National Laboratory)1998.
全国の図書館

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