並列タイトル等Spectroscopic characterization of InX 8X=Cl, Br) thin films
一般注記InX (X=Cl, Br) can be made amorphous by quench deposition of thin films. The amorphous films have well defined, characteristic crystallization temperature (125K for InCl and 124K for InBr) at which the corresponding optical absorption spectra drastically change their patterns. There is tendency for very thin (<10nm) films to crystallize at higher temperature with decreasing thickness due to enhanced surface effects. It is also found that very thin (<5nm) InCl films deposited onto KCL substrates at room temperature crystallize in a cubic structure when annealed at 290K for more than 24h.
連携機関・データベース国立情報学研究所 : 学術機関リポジトリデータベース(IRDB)(機関リポジトリ)