Detailed results of this period: Growth of homogeneous Si(0.5)Ge(0.5) single crystals by the Traveling Liquidus-Zone Method

• 資料種別: 文書・図像類
• タイトル: Detailed results of this period: Growth of homogeneous Si(0.5)Ge(0.5) single crystals by the Traveling Liquidus-Zone Method
• 著者・編者: 宮田, 浩旭; 緒方, 康行; 木下, 恭一; 足立, 聡; 依田, 真一; 鶴, 哲也; 村松, 祐治; Miyata, Hiroaki; Ogata, Yasuyuki; Kinoshita, Kyoichi; Adachi, Satoshi; Yoda, Shinichi; Tsuru, Tetsuya; Muramatsu, Yuji
• 著者標目: 宮田, 浩旭; 緒方, 康行; 木下, 恭一; 足立, 聡; 依田, 真一; 鶴, 哲也; 村松, 祐治; Miyata, Hiroaki; Ogata, Yasuyuki; Kinoshita, Kyoichi; Adachi, Satoshi; Yoda, Shinichi; Tsuru, Tetsuya; Muramatsu, Yuji
• 出版事項: 宇宙航空研究開発機構
• 出版年月日等: 2005-03-31
• 出版年（W3CDTF）: 2005-03-31
• 並列タイトル等: 今期の詳細な結果:Traveling Liquidus-Zone法による均一なSi(0.5)Ge(0.5)単結晶の成長
• タイトル（掲載誌）: 宇宙航空研究開発機構研究開発報告 = JAXA Research and Development Report: Effects of Microgravity Environment on Growth Related Properties of Semiconductor Alloys (InGaAs): Growth of Homogeneous Crystals
• 巻号年月日等（掲載誌）: JAXA-RR-04-022E
• 掲載巻: JAXA-RR-04-022E
• 掲載ページ: 7-13
• ISSN（掲載誌）: ISSN : 1349-1113
• 本文の言語コード: eng
• 件名標目: 結晶成長; 飽和溶融帯移動法; シリコン化合物; 液相線; 結晶性; 薄膜; Si-Ge結晶; 物質拡散; 拡散係数; X線回折; ラウエ法; 成長速度; 状態図; crystal growth; traveling liquidus-zone method; silicon compound; liquidus; crystallinity; thin film; Si-Ge crystal; mass transfer; diffusion coefficient; X-ray diffraction; Laue method; growth rate; phase diagram
• 対象利用者: 一般
• 一般注記: The Si(0.5)Ge(0.5) bulk crystals growth has been challenged. Si-Ge homogeneous single crystals are difficult to grow so far. In the present research, the Traveling Liquidus-Zone method (TLZ method) which was invented in the group as a new crystal growth method to the growth of Si-Ge has been applied. The diameter of grown crystal was 2 mm and the length was 15 mm. Crystals were well seeded and had the orientation of silicon seeds in spite of the large lattice mismatch. The compositional variation of the crystals was very small and the composition was in the mole fraction range of 0.5 +/- 0.016 in germanium. The lattice constant determined by the X-ray powder diffraction was 55.38 nm.; 資料番号: AA0048451001; レポート番号: JAXA-RR-04-022E
• 一次資料へのリンクURL: https://jaxa.repo.nii.ac.jp/?action=repository_action_common_download&item_id=2363&item_no=1&attribute_id=31&file_no=1
• オンライン閲覧公開範囲: 限定公開
• 連携機関・データベース: 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）; https://irdb.nii.ac.jp
• 提供元機関・データベース: 宇宙航空研究開発機構 : 宇宙航空研究開発機構リポジトリ