ISBN[3527317066] (cased : set)
9783527317066 (cased : set)
寄与者edited by Gustaaf Van Tendeloo, Dirk Van Dyck, and Stephen J. Pennycook.
一般注記The past, the present, and the future of nanoscopy / Gustaav Van Tendeloo and Dirk Van Dyck -- Transmission electron microscopy / Marc De Graef -- Atomic resolution electron microscopy / Dirk Van Dyck -- Ultrahigh-resolution transmission electron microscopy at negative spherical aberration / Knut W. Urban ... [et al.] -- Z-contrast imaging / Stephen J. Pennycook ... [et al.] -- Electron holography / Hannes Lichte -- Lorentz microscopy and electron holography of magnetic materials / Rafal E. Dunin-Borkowski ... [et al.] -- Electron tomography / Paul Anthony Midgley and Sara Bals -- Statistical parameter estimation theory - a tool for quantitative electron microscopy / Sandra Van Aert -- Dynamic transmission electron microscopy / Nigel D. Browning ... [et al.] -- Transmission electron microscopy as nanolab / Frans D. Tichelaar, Marijn A. van Huis, and Henny W. Zandbergen -- Atomic-resolution environmental transmission electron microscopy / Pratibha L. Gai and Edward D. Boyes -- Speckles in images and diffraction patterns / Michael M. J. Treacy -- Coherent electron diffractive imaging / J.M. Zuo and Weijie Huang -- Sample preparation techniques for transmission electron microscopy / Vasfi Burak Özdöl, Vesna Srot, and Peter A. van Aken -- Scanning probe microscopy - history, background, and state of the art / Ralf Heiderhoff and Ludwig Josef Balk -- Scanning probe microscopy--forces and currents in the nanoscale world / Brian J. Rodriguez ... [et al.] -- Scanning beam methods / David Joy -- Fundamentals of the focused ion beam system / Nan Yao.