Handbook of nanoscopy. Vol. 1 /

Material type: 図書

Author: -

Publisher: Wiley-VCH ;

Publication date: c2012.

Material Format: Paper

Capacity, size, etc.: xxx, 671 p. : ; 25 cm.

Collection: -

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Notes on use

Note (General)：: The past, the present, and the future of nanoscopy / Gustaav Van Tendeloo and Dirk Van Dyck -- Transmission electron microscopy / Marc De Graef -- Ato...

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東京都立中央図書館
Paper
Call No.：
549.9-H23-H2-1
Book Registration Number：
7102252648
東京都立中央図書館
東京都立中央図書館
Paper
Call No.：
549.9-H23-H2-2
Book Registration Number：
7102252657
東京都立中央図書館

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Paper

Material Type: 図書
ISBN: [3527317066] (cased : set)
9783527317066 (cased : set)
Title: Handbook of nanoscopy.
Volume: Vol. 1 /
Publication, Distribution, etc.: Weinheim : : Wiley-VCH ;
[Chichester : : John Wiley, distributor],
Publication Date: c2012.
Extent: xxx, 671 p. : ; 25 cm.
Contributor: edited by Gustaaf Van Tendeloo, Dirk Van Dyck, and Stephen J. Pennycook.
Text Language Code: eng
NDC 10th ed.: 549.97 : Electronic engineering
Target Audience: 一般
Note (General): The past, the present, and the future of nanoscopy / Gustaav Van Tendeloo and Dirk Van Dyck -- Transmission electron microscopy / Marc De Graef -- Atomic resolution electron microscopy / Dirk Van Dyck -- Ultrahigh-resolution transmission electron microscopy at negative spherical aberration / Knut W. Urban ... [et al.] -- Z-contrast imaging / Stephen J. Pennycook ... [et al.] -- Electron holography / Hannes Lichte -- Lorentz microscopy and electron holography of magnetic materials / Rafal E. Dunin-Borkowski ... [et al.] -- Electron tomography / Paul Anthony Midgley and Sara Bals -- Statistical parameter estimation theory - a tool for quantitative electron microscopy / Sandra Van Aert -- Dynamic transmission electron microscopy / Nigel D. Browning ... [et al.] -- Transmission electron microscopy as nanolab / Frans D. Tichelaar, Marijn A. van Huis, and Henny W. Zandbergen -- Atomic-resolution environmental transmission electron microscopy / Pratibha L. Gai and Edward D. Boyes -- Speckles in images and diffraction patterns / Michael M. J. Treacy -- Coherent electron diffractive imaging / J.M. Zuo and Weijie Huang -- Sample preparation techniques for transmission electron microscopy / Vasfi Burak Özdöl, Vesna Srot, and Peter A. van Aken -- Scanning probe microscopy - history, background, and state of the art / Ralf Heiderhoff and Ludwig Josef Balk -- Scanning probe microscopy--forces and currents in the nanoscale world / Brian J. Rodriguez ... [et al.] -- Scanning beam methods / David Joy -- Fundamentals of the focused ion beam system / Nan Yao.
Holding library: 東京都立中央図書館
Note (Library): 301
Call No.: 549.9-H23-H2-1
Data Provider (Database): 東京都立中央図書館 : 公共図書館蔵書
Bibliographic ID (SomokuID): 1352006552
7102252648
OCLC No.: 2012418090
https://www.worldcat.org/oclc/2012418090
(OCoLC)754168840
https://www.worldcat.org/oclc/(OCoLC)754168840