Journal of electron microscopy

• 資料種別: 雑誌
• ISSN: 0022-0744
• タイトル: Journal of electron microscopy
• 巻次・部編番号: 42(1)-42(6):1993.2-1993.12
• 出版事項: Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press
• 出版年月日等: 1993
• 出版年（W3CDTF）: 1993
• 出版地（国名コード）: GB
• 本文の言語コード: eng
• NDLC: ZN33
• 一般注記: Vol.22, n.1-vol.45, n.6, published by Japanese Society of Electron Microscopy in Tokyo
• 所蔵機関: 国立国会図書館
• 請求記号: Z53-T76
• 改題前: 継続前; https://ndlsearch.ndl.go.jp/books/R100000002-I000000015810
• 改題後: 継続後 : Microscopy (ISSN:2050-5698); https://ndlsearch.ndl.go.jp/books/R100000002-I024336909
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000000129291; http://id.ndl.go.jp/bib/000000129291
• 目録規則: 日本目録規則1987年版改訂版
• 整理区分コード: 231

目次

Cross-Sectional Observations of Layer Structures and Stacking Faults in Natural and Synthesized Molybdenum Disulfide Crystals by High-Resolution Transmission Electron Microscopy

An Application of Digital Filtering in Electron Holography at Atomic Resolution

Development of a Specimen Transfer System for Nano Structure Imaging in High Resolution Electron Microscopy

Imaging of the Surface Structures of Epon Thin Sections Created with a Glass Knife and a Diamond Knife by the Atomic Force Microscope

Intensity Measurement of High Voltage Electron Microscopic Images by YAG-TV Recording Systems

Visualization of Oxygen Atoms in YBa2Cu3O6+x High-Tc Superconductors by Ultra-High-Resolution Electron Microscopy

Optical Diffractometry of a Picture Appearing on Liquid Crystal TV and Its Application to High-Resolution Transmission Electron Microscopy

A Device for in situ Embedding of Monolayer Cultures in Lowicryl K4M

Stage-Dependent Association of Nuclear and Chloroplast DNA Molecules Through Bridges Transiently Formed between the Two Organelles in Synchronized Cells of Euglena gracilis

Atomic Force Microscopy(AFM) of the Cuticular Pigment Globules of the Quail Egg Shell

Development of an Ultrahigh Vacuum High Resolution Scanning Transmission Electron Microscope

Extended Antiphase Boundaries in the DO3 Ordered Phase in a Nonstoichiometric Fe3Si Alloy

Scanning Electron Microscopy of the Myosin-Coated Surface of Polystyrene Beads in a Force-Movement Assay System for ATP-Dependent Actin-Myosin Sliding

An Ultrathin Frozen Section Is Suitable for Demonstrating Cytochrome c Oxidase Activity at Electron Microscopic Level

I-Band Periodicity in Rabbit Psoas Muscle Fibers Measured Using Digital Image-Analysis Techniques

Determination of Partially Coherent Parameters by Lattice Image Contrast in TEM

Frequency Dependence of Inductance Due to Slow Flux Penetration into Magnetic Circuit of Lens

Investigation of Micro Mechanical Vibration of Piezoelectric Actuators Using a Stroboscopic SEM

Cu L2,3 White Lines of Cu Compounds Studied by Electron Energy Loss Spectroscopy

The Morphology of Precipitates in an Al-1wt% Mg2Si Alloy

Journal of Electron Microscopy Contents,Vol.42(1993年)

Developments in Application of High Voltage Electron Microscope(Seto Award 1992)

HVEM Study on the Non-Equilibrium Solid Phases Produced by MeV Electron Irradiation(Seto Award 1992)

Performance Characteristics of Radioluminescent Fiber Optics as Electron Scintillators

A Simple Method of Chromium Coating Using a Ferrotype Plate for Scanning Electron Microscopy

The Forty-ninth Annual Meeting of the Japanese Society of Electron Microscopy

High-Resolution Electron Microscopy of Short-Range Ordered Structure of Ga0.5In0.5P

Resolution Enhancement of Electron Energy-Loss Spectra Using the Maximum Entropy Method

Detection of Oxygen Vacancies in BaMnO3-x with 200kV Electron Microscopes

Detection of Endogenous Avidin-Binding Proteins in Rat Liver Cells by Transblot and Electron Microscopy