Proceedings / ATE Central, Automated Testing for Electronics Manufacturing Conference ; s ponsored by Electronics test, October 4-6, 1983, O'Hare Exposition and Conference Center, Rosemont, IL.

• 資料種別: 図書
• タイトル: Proceedings / ATE Central, Automated Testing for Electronics Manufacturing Conference ; s ponsored by Electronics test, October 4-6, 1983, O'Hare Exposition and Conference Center, Rosemont, IL.
• タイトル標目: Electronics test.
• 著者標目: Automated Testing for Electronics Manufacturing Conference (1983 : Rosemont, Ill.)
• 出版事項: [New York] : Morgan-Grampian Pub. Co.
• 出版年月日等: c1983.
• 出版年（W3CDTF）: 1983
• 数量: 1 v. (various pagings) : ill. ; 28 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Electronic apparatus and appliances -- Testing -- Congresses.; Automatic checkout equipment -- Congresses.
• LCC: TK7836
• DDC: 621.381/028/7
• NDLC: M15; ND
• 書誌注記: Includes bibliographies.
• 所蔵機関: 国立国会図書館
• 請求記号: M15-A5885
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000003112674; http://id.ndl.go.jp/bib/000003112674
• LC control number: 83244307; https://lccn.loc.gov/83244307
• 整理区分コード: 211