International symposium on quality electronic design : proceedings : 18-21 March 2002 : San Jose, California. : Mar 2002, San Jose, CA.

• 資料種別: 図書
• ISBN: 0769515614; 0769515622 (case); 0769515630 (microfiche)
• タイトル: International symposium on quality electronic design : proceedings : 18-21 March 2002 : San Jose, California. : Mar 2002, San Jose, CA.
• 著者標目: International Symposium on Quality Electronic Design (3rd : 2002 : San Jose, California)
• 出版事項: Los Alamitos : IEEE Computer Society
• 出版年月日等: c2002.
• 出版年（W3CDTF）: 2002
• 数量: xxii, 549 p. : ill. ; 28 cm.
• 並列タイトル等: Proceedings of the ISQED 2002 : 2002 3rd international symposium on quality electronic design : 18-21 March 2002 : San Jose, California
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Very large scale integration -- Reliability -- Congresses.; Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.; Integrated circuits -- Very large scale integration -- Computer-aided design -- Congresses.; Integrated circuits -- Very large scale integration -- Testing -- Quality control -- Congresses.
• NDLC: M17
• 一般注記: Programme and papers.; IEEE cat no PR01561.
• 書誌注記: Includes bibliographic references and author index.
• 別の媒体に関する注記: Also available via the World Wide Web.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-03-4463
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000004235349; http://id.ndl.go.jp/bib/000004235349
• LC control number: 2002101055; https://lccn.loc.gov/2002101055
• RLIN番号: NYCGAUK9776-B
• 整理区分コード: 215